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AIP Publishing
Review of Scientific Instruments (317)
Abstract

A new method of measuring electrical resistance in a diamond-anvil cell has been developed. The sample assembly consisting of copper-plate electrodes and polymer film has been used for a modified two-probe method. The resistance measurements have been carried out at pressures up to 250 kbar and temperatures down to 1.7 K using a diamond-anvil cell driven by helium gas. This method has been applied to investigate the pressure-induced phase transition in iodine and superconducting transition in hydrogenated amorphous silicon films.

Bibliography

Sakai, N., Kajiwara, T., Tsuji, K., & Minomura, S. (1982). Electrical resistance measurements at high pressure and low temperature using a diamond-anvil cell. Review of Scientific Instruments, 53(4), 499–502.

Authors 4
  1. Nobuko Sakai (first)
  2. Takashi Kajiwara (additional)
  3. Kazuhiko Tsuji (additional)
  4. Shigeru Minomura (additional)
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Dates
Type When
Created 22 years, 5 months ago (March 10, 2003, 1:11 p.m.)
Deposited 1 year, 6 months ago (Feb. 10, 2024, 2:09 p.m.)
Indexed 1 year ago (Aug. 6, 2024, 4:31 a.m.)
Issued 43 years, 4 months ago (April 1, 1982)
Published 43 years, 4 months ago (April 1, 1982)
Published Print 43 years, 4 months ago (April 1, 1982)
Funders 0

None

@article{Sakai_1982, title={Electrical resistance measurements at high pressure and low temperature using a diamond-anvil cell}, volume={53}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1136997}, DOI={10.1063/1.1136997}, number={4}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Sakai, Nobuko and Kajiwara, Takashi and Tsuji, Kazuhiko and Minomura, Shigeru}, year={1982}, month=apr, pages={499–502} }