Abstract
An improved technique for the measurement of ion angular distributions of electron stimulated desorption (ESDIAD) has been developed. The use of a chopped electron beam in connection with a gated detector system significantly reduces the background in the ESDIAD patterns. A comparison of experimental data obtained with the improved scan and the conventional display technique is presented. The essential advantages of the new method are increased sensitivity, low background, high-angular resolution and ion energy determination at any desired point of the ESDIAD pattern.
References
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{'key': '2024021103443048900_r9'}
Dates
Type | When |
---|---|
Created | 22 years, 5 months ago (March 10, 2003, 1:08 p.m.) |
Deposited | 1 year, 6 months ago (Feb. 10, 2024, 10:44 p.m.) |
Indexed | 1 year, 6 months ago (Feb. 10, 2024, 11:10 p.m.) |
Issued | 44 years, 8 months ago (Jan. 1, 1981) |
Published | 44 years, 8 months ago (Jan. 1, 1981) |
Published Print | 44 years, 8 months ago (Jan. 1, 1981) |
@article{Niehus_1981, title={Improved technique in electron stimulated desorption ion angular distributions}, volume={52}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1136446}, DOI={10.1063/1.1136446}, number={1}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Niehus, H. and Krahl-Urban, B.}, year={1981}, month=jan, pages={56–59} }