Crossref journal-article
AIP Publishing
Review of Scientific Instruments (317)
Abstract

A convenient piezoelectric driven Kelvin probe for the measurement of work function changes is described. The probe has a simple construction, is small, bakeable, and can be mounted on any 35-mm-i.d. UHV flange. As the piezoelectric device is inside the vacuum chamber, only one electrical feedthrough is needed for operating the probe. The distance between reference electrode and sample can be varied within ±0.5 mm simply by applying a dc voltage to the piezoelectric device in addition to the ac oscillator-driving voltage, not requiring any mechanical driving and feedthrough provisions. The probe was tested studying the adsorption of O2 on Pt(111). The sensitivity for contact potential measurements is better than 0.1 mV at a response time of 10 sec.

Bibliography

Besocke, K., & Berger, S. (1976). Piezoelectric driven Kelvin probe for contact potential difference studies. Review of Scientific Instruments, 47(7), 840–842.

Authors 2
  1. K. Besocke (first)
  2. S. Berger (additional)
References 10 Referenced 171
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Dates
Type When
Created 22 years, 5 months ago (March 10, 2003, 12:42 p.m.)
Deposited 2 years, 1 month ago (July 1, 2023, 9:27 p.m.)
Indexed 4 days, 1 hour ago (Aug. 27, 2025, 12:03 p.m.)
Issued 49 years, 1 month ago (July 1, 1976)
Published 49 years, 1 month ago (July 1, 1976)
Published Online 17 years ago (Aug. 28, 2008)
Published Print 49 years, 1 month ago (July 1, 1976)
Funders 0

None

@article{Besocke_1976, title={Piezoelectric driven Kelvin probe for contact potential difference studies}, volume={47}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1134750}, DOI={10.1063/1.1134750}, number={7}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Besocke, K. and Berger, S.}, year={1976}, month=jul, pages={840–842} }