Abstract
A novel fabrication method for ultrafine silicon wires is presented. To achieve electron physical confinement with a high potential SiO2 barrier, the SIMOX (separation by implanted oxygen) technique, electron beam lithography, anisotropic chemical etching, and thermal oxidation are used. The size of the wires is controlled by the lithography, the thickness of the top silicon layer and the thermal oxidation for narrowing the patterned silicon wire. The steplike structure in the conductance versus gate voltage curve, which remains up to higher temperatures for a smaller wire, suggests that a strong one-dimensional transport effect occurs in this silicon wire.
References
11
Referenced
57
10.1103/PhysRevLett.60.848
/ Phys. Rev. Lett. (1988)10.1088/0022-3719/21/8/002
/ J. Phys. C (1988)10.1103/PhysRevB.45.13799
/ Phys. Rev. B (1992)10.1103/PhysRevB.46.12873
/ Phys. Rev. B (1992){'key': '2024020308105362200_r5'}
10.1016/0168-583X(91)96291-R
/ Nucl. Instrum. Methods Phys. Res. B (1991){'key': '2024020308105362200_r7', 'first-page': '1019', 'volume': 'ED-40', 'year': '1993', 'journal-title': 'IEEE Trans. Electron Devices'}
/ IEEE Trans. Electron Devices (1993){'key': '2024020308105362200_r8', 'first-page': '1008', 'volume': 'ED-34', 'year': '1987', 'journal-title': 'IEEE Trans. Electron Devices'}
/ IEEE Trans. Electron Devices (1987){'key': '2024020308105362200_r9', 'first-page': '25', 'volume': 'ED-35', 'year': '1988', 'journal-title': 'IEEE Trans. Electron Devices'}
/ IEEE Trans. Electron Devices (1988)10.1147/rd.13.0223
/ IBM J. Res. Dev. (1957)10.1103/PhysRevB.31.6207
/ Phys. Rev. B (1985)
Dates
Type | When |
---|---|
Created | 23 years ago (July 26, 2002, 9:39 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 3:11 a.m.) |
Indexed | 3 months ago (May 21, 2025, 4:47 p.m.) |
Issued | 30 years, 8 months ago (Nov. 28, 1994) |
Published | 30 years, 8 months ago (Nov. 28, 1994) |
Published Print | 30 years, 8 months ago (Nov. 28, 1994) |
@article{Nakajima_1994, title={Fabrication of a silicon quantum wire surrounded by silicon dioxide and its transport properties}, volume={65}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.112991}, DOI={10.1063/1.112991}, number={22}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Nakajima, Y. and Takahashi, Y. and Horiguchi, S. and Iwadate, K. and Namatsu, H. and Kurihara, K. and Tabe, M.}, year={1994}, month=nov, pages={2833–2835} }