Abstract
We have observed intense line spectra in the neighborhood of 1.54 μm from erbium-implanted samples of 4H, 6H, 15R, and 3C SiC. Samples were implanted to a fluence of about 1013 erbium ions/cm2 using four implant energies. An anneal at 1700 °C in a SiC cavity was used. The temperature dependence of the integrated luminescence intensity from 1.49 to 1.64 μm varies very little from 2 to 400 K. No major differences are found for the spectra of the hexagonal and rhombohedral polytypes but there is a difference for cubic SiC (3C SiC).
References
12
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:38 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 2:56 a.m.) |
Indexed | 4 months ago (April 25, 2025, 3:48 a.m.) |
Issued | 30 years, 11 months ago (Sept. 26, 1994) |
Published | 30 years, 11 months ago (Sept. 26, 1994) |
Published Print | 30 years, 11 months ago (Sept. 26, 1994) |
@article{Choyke_1994, title={Intense erbium-1.54-μm photoluminescence from 2 to 525 K in ion-implanted 4H, 6H, 15R, and 3C SiC}, volume={65}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.112908}, DOI={10.1063/1.112908}, number={13}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Choyke, W. J. and Devaty, R. P. and Clemen, L. L. and Yoganathan, M. and Pensl, G. and Hässler, Ch.}, year={1994}, month=sep, pages={1668–1670} }