DOI: 10.1063/1.112617. Effect of ultraviolet light on fatigue of lead zirconate titanate thin-film capacitors

Effect of ultraviolet light on fatigue of lead zirconate titanate thin-film capacitors

10.1063/1.112617

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

Fatigue of Pb(Zr0.52Ti0.48)O3 (PZT) thin-film capacitors was studied under UV light (He-Cd laser, λ=325 nm). The remanent polarization of the PZT film capacitors increased upon light illumination. Fatigue resistance was also improved under UV light. During fatigue test, the change in polarization of PZT films upon UV light illumination increased gradually with cycling. These results were examined within the framework of the polarization screening model, which is suggested as an essential process for fatigue. This leads to a conclusion that more charged defects are involved in the fatigue process through internal screening of polarization.

Bibliography

Lee, J., Esayan, S., Safari, A., & Ramesh, R. (1994). Effect of ultraviolet light on fatigue of lead zirconate titanate thin-film capacitors. Applied Physics Letters, 65(2), 254â256.

Authors 4

J. Lee (first)
S. Esayan (additional)
A. Safari (additional)
R. Ramesh (additional)

References 26 Referenced 42

{'key': '2024020307325751700_r1', 'volume': '243', 'year': '1991', 'journal-title': 'Mater. Res. Soc. Symp. Proc.'} / Mater. Res. Soc. Symp. Proc. (1991)
{'key': '2024020307325751700_r1a'}
10.1126/science.246.4936.1400 / Science (1989)
10.1080/00150199008018730 / Ferroelectrics (1990)
10.1116/1.578044 / J. Vac. Sci. Technol. A (1992)
{'key': '2024020307325751700_r4'}
{'key': '2024020307325751700_r5'}
10.1109/55.62994 / IEEE Electron Device Lett. (1990)
{'key': '2024020307325751700_r6'}
10.1080/00150199008008235 / Ferroelectrics (1990)
10.1063/1.349422 / J. Appl. Phys. (1991)
10.1063/1.107488 / Appl. Phys. Lett. (1992)
10.1063/1.109739 / Appl. Phys. Lett. (1993)
{'key': '2024020307325751700_r10'}
{'key': '2024020307325751700_r10a'}
{'key': '2024020307325751700_r11'}
10.1063/1.346948 / J. Appl. Phys. (1990)
10.1080/00150199108007934 / Ferroelectrics (1991)
10.1557/PROC-243-323 / Mater. Res. Soc. Symp. Proc. (1991)
10.1063/1.350286 / J. Appl. Phys. (1991)
10.1143/JJAP.9.1236 / Jpn. J. Appl. Phys. (1970)
{'key': '2024020307325751700_r16'}
{'key': '2024020307325751700_r17'}
10.1557/PROC-243-21 / Mater. Res. Soc. Symp. Proc. (1991)
10.1557/PROC-310-87 / Mater. Res. Soc. Symp. Proc. (1993)
{'key': '2024020307325751700_r20'}

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:39 a.m.)
Deposited	1 year, 7 months ago (Feb. 3, 2024, 2:33 a.m.)
Indexed	1 year, 6 months ago (Feb. 7, 2024, 12:25 a.m.)
Issued	31 years, 1 month ago (July 11, 1994)
Published	31 years, 1 month ago (July 11, 1994)
Published Print	31 years, 1 month ago (July 11, 1994)

Funders 0

None

BibTeX

@article{Lee_1994, title={Effect of ultraviolet light on fatigue of lead zirconate titanate thin-film capacitors}, volume={65}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.112617}, DOI={10.1063/1.112617}, number={2}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Lee, J. and Esayan, S. and Safari, A. and Ramesh, R.}, year={1994}, month=jul, pages={254–256} }

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