DOI: 10.1063/1.112496. Near field emission scanning tunneling microscopy

Near field emission scanning tunneling microscopy

10.1063/1.112496

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

The close proximity between probe and sample in a scanning tunneling microscope interface may produce unwanted modifications of the interface. This is particularly severe when working with soft materials, as molecular films or biomolecules. Here, we propose the operation of the scanning tunneling microscope in the near field emission regime as an effective method to overcome those problems. A theoretical description of the probe–sample interface in the near field emission regime predicts subatomic resolution in the direction normal to the surface and lateral resolution of 3 nm for tip–sample separations of 3–5 nm. Furthermore, atomic resolution is demonstrated by imaging steps of carbon atoms.

Bibliography

SÃ¡enz, J. J., & GarcÃa, R. (1994). Near field emission scanning tunneling microscopy. Applied Physics Letters, 65(23), 3022â3024.

Authors 2

Juan José Sáenz (first)
Ricardo García (additional)

References 16 Referenced 35

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{'key': '2024020308122677700_r2'}
10.1063/1.111795 / Appl. Phys. Lett. (1994)
10.1063/1.111597 / Appl. Phys. Lett. (1994)
{'key': '2024020308122677700_r5', 'first-page': '260', 'volume': '1451', 'year': '1993', 'journal-title': 'Science'} / Science (1993)
{'key': '2024020308122677700_r6', 'first-page': '1227', 'volume': '9', 'year': '1991', 'journal-title': 'J. Vac. Sci. Technol. B'} / J. Vac. Sci. Technol. B (1991)
10.1063/1.110839 / Appl. Phys. Lett. (1994)
10.1063/1.1685846 / Rev. Sci. Instrum. (1972)
{'key': '2024020308122677700_r9', 'first-page': '73', 'volume': '8', 'year': '1989', 'journal-title': 'J. Phys. C'} / J. Phys. C (1989)
{'key': '2024020308122677700_r10'}
10.1063/1.107090 / Appl. Phys. Lett. (1992)
10.1063/1.1777199 / J. Appl. Phys. (1962)
10.1016/0039-6028(91)90437-W / Surf. Sci. (1991)
10.1063/1.1702682 / J. Appl. Phys. (1963)
{'key': '2024020308122677700_r15'}
{'key': '2024020308122677700_r16', 'first-page': '956', 'volume': '299–300', 'year': '1994', 'journal-title': 'Surf. Sci.'} / Surf. Sci. (1994)

Dates

Type	When
Created	23 years ago (July 26, 2002, 9:39 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 3:12 a.m.)
Indexed	1 year, 6 months ago (Feb. 10, 2024, 1:05 p.m.)
Issued	30 years, 8 months ago (Dec. 5, 1994)
Published	30 years, 8 months ago (Dec. 5, 1994)
Published Print	30 years, 8 months ago (Dec. 5, 1994)

Funders 0

None

BibTeX

@article{S_enz_1994, title={Near field emission scanning tunneling microscopy}, volume={65}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.112496}, DOI={10.1063/1.112496}, number={23}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Sáenz, Juan José and García, Ricardo}, year={1994}, month=dec, pages={3022–3024} }

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