DOI: 10.1063/1.112106. Adhesion force imaging in air and liquid by adhesion mode atomic force microscopy

Adhesion force imaging in air and liquid by adhesion mode atomic force microscopy

10.1063/1.112106

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

A new imaging mode for the atomic force microscope (AFM), yielding images mapping the adhesion force between tip and sample, is introduced. The adhesion mode AFM takes a force curve at each pixel by ramping a piezoactuator, moving the silicon-nitride tip up and down towards the sample. During the retrace the tip leaves the sample with an adhesion dip showing up in the force curve. Adhesion force images mapping parameters describing this adhesion dip, such as peak value, width, and area, are acquired on-line together with the sample topography. Imaging in air gives information on the differences in hydrophobicity of sample features. While imaging a mercaptopentadecane-gold layer on glass in demineralized water, the adhesion force could be modulated by adding phosphate buffered saline.

Bibliography

van der Werf, K. O., Putman, C. A. J., de Grooth, B. G., & Greve, J. (1994). Adhesion force imaging in air and liquid by adhesion mode atomic force microscopy. Applied Physics Letters, 65(9), 1195â1197.

Authors 4

Kees O. van der Werf (first)
Constant A. J. Putman (additional)
Bart G. de Grooth (additional)
Jan Greve (additional)

References 21 Referenced 172

10.1103/PhysRevLett.56.930 / Phys. Rev. Lett. (1986)
10.1063/1.338807 / J. Appl. Phys. (1987)
{'key': '2024020307474027500_r3', 'first-page': 'L688', 'volume': '290', 'year': '1993', 'journal-title': 'Surf. Sci. Lett.'} / Surf. Sci. Lett. (1993)
10.1063/1.111597 / Appl. Phys. Lett. (1994)
10.1063/1.111795 / Appl. Phys. Lett. (1994)
10.1063/1.103122 / Appl. Phys. Lett. (1990)
10.1016/0304-3991(92)90170-O / Ultramicroscopy (1992)
10.1038/359133a0 / Nature (1992)
10.1088/0957-4484/2/2/004 / Nanotechnology (1991)
10.1016/S0006-3495(93)81433-4 / Biophys. J. (1993)
10.1063/1.1145130 / Rev. Sci. Instrum. (1994)
10.1063/1.101024 / Appl. Phys. Lett. (1989)
10.1103/PhysRevB.45.11226 / Phys. Rev. B. (1992)
10.1088/0957-4484/2/3/003 / Nanotechnology (1991)
10.1016/S0006-3495(91)82180-4 / Biophys. J. (1991)
10.1063/1.1144378 / Rev. Sci. Instrum. (1993)
10.1021/j100114a017 / J. Phys. Chem. (1993)
10.1063/1.355313 / J. Appl. Phys. (1993)
10.1021/ja00038a075 / J. Amer. Chem. Soc. (1992)
10.1021/la00014a003 / Langmuir (1994)
{'key': '2024020307474027500_r21'}

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:39 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 2:47 a.m.)
Indexed	18 hours, 20 minutes ago (Aug. 29, 2025, 6:30 a.m.)
Issued	31 years ago (Aug. 29, 1994)
Published	31 years ago (Aug. 29, 1994)
Published Print	31 years ago (Aug. 29, 1994)

Funders 0

None

BibTeX

@article{van_der_Werf_1994, title={Adhesion force imaging in air and liquid by adhesion mode atomic force microscopy}, volume={65}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.112106}, DOI={10.1063/1.112106}, number={9}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={van der Werf, Kees O. and Putman, Constant A. J. and de Grooth, Bart G. and Greve, Jan}, year={1994}, month=aug, pages={1195–1197} }

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