Abstract
Tapping mode atomic force microscopy in liquids gives a substantial improvement in imaging quality and stability over standard contact mode. In tapping mode the probe-sample separation is modulated as the probe scans over the sample. This modulation causes the probe to tap on the surface only at the extreme of each modulation cycle and therefore minimizes frictional forces that are present when the probe is constantly in contact with the surface. This imaging mode increases resolution and reduces sample damage on soft samples. For our initial experiments we used a tapping frequency of 17 kHz to image deoxyribonucleic acid plasmids on mica in water. When we imaged the same sample region with the same cantilever, the plasmids appeared 18 nm wide in contact mode and 5 nm in tapping mode.
Bibliography
Hansma, P. K., Cleveland, J. P., Radmacher, M., Walters, D. A., Hillner, P. E., Bezanilla, M., Fritz, M., Vie, D., Hansma, H. G., Prater, C. B., Massie, J., Fukunaga, L., Gurley, J., & Elings, V. (1994). Tapping mode atomic force microscopy in liquids. Applied Physics Letters, 64(13), 1738â1740.
Authors
14
- P. K. Hansma (first)
- J. P. Cleveland (additional)
- M. Radmacher (additional)
- D. A. Walters (additional)
- P. E. Hillner (additional)
- M. Bezanilla (additional)
- M. Fritz (additional)
- D. Vie (additional)
- H. G. Hansma (additional)
- C. B. Prater (additional)
- J. Massie (additional)
- L. Fukunaga (additional)
- J. Gurley (additional)
- V. Elings (additional)
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26
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Dates
Type | When |
---|---|
Created | 23 years ago (July 26, 2002, 9:38 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 2:04 a.m.) |
Indexed | 1 month, 3 weeks ago (June 27, 2025, 6:35 a.m.) |
Issued | 31 years, 4 months ago (March 28, 1994) |
Published | 31 years, 4 months ago (March 28, 1994) |
Published Print | 31 years, 4 months ago (March 28, 1994) |
@article{Hansma_1994, title={Tapping mode atomic force microscopy in liquids}, volume={64}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.111795}, DOI={10.1063/1.111795}, number={13}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Hansma, P. K. and Cleveland, J. P. and Radmacher, M. and Walters, D. A. and Hillner, P. E. and Bezanilla, M. and Fritz, M. and Vie, D. and Hansma, H. G. and Prater, C. B. and Massie, J. and Fukunaga, L. and Gurley, J. and Elings, V.}, year={1994}, month=mar, pages={1738–1740} }