Abstract
The structure and stability of thin tungsten films prepared by radio frequency magnetron sputter deposition have been studied by x-ray diffraction and x-ray photoelectron spectroscopy. The structure of these films has been found to systematically evolve from the metastable A15 β-W phase to the equilibrium A2 α-W phase with decreasing oxygen impurity concentration. Within the β-W phase a decrease in the concentration of incorporated oxygen results in a monotonic decrease in the lattice parameter of the unit cell until the β-W phase eventually becomes unstable, and the α-W phase is formed.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:38 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 2:24 a.m.) |
Indexed | 1 month ago (July 23, 2025, 8:22 a.m.) |
Issued | 31 years, 2 months ago (June 13, 1994) |
Published | 31 years, 2 months ago (June 13, 1994) |
Published Print | 31 years, 2 months ago (June 13, 1994) |
@article{Weerasekera_1994, title={Structure and stability of sputter deposited beta-tungsten thin films}, volume={64}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.111318}, DOI={10.1063/1.111318}, number={24}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Weerasekera, I. A. and Shah, S. Ismat and Baxter, David V. and Unruh, K. M.}, year={1994}, month=jun, pages={3231–3233} }