Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

The in-plane transport properties of a strained (100) Si layer on a relaxed Si1−xGex substrate are studied with an ensemble Monte Carlo technique. Similar velocity (-field) characteristics are found for strained Si with any valley splitting energy ΔE≥0.1 eV. These phonon-limited electron mobilities reach 4000 cm2/V s at 300 K, and 23 000 cm2/V s at 77 K. There is only a slight increase in the saturation velocity at both temperatures. However, a significant overshoot peak transient velocity is found to depend upon ΔE, and for ΔE=0.4 eV, reaches 4.1×107 cm/s at 300 K, and 5.2×107 cm/s at 77 K.

Bibliography

Miyata, H., Yamada, T., & Ferry, D. K. (1993). Electron transport properties of a strained Si layer on a relaxed Si1−xGex substrate by Monte Carlo simulation. Applied Physics Letters, 62(21), 2661–2663.

Authors 3
  1. H. Miyata (first)
  2. Toshishige Yamada (additional)
  3. D. K. Ferry (additional)
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Dates
Type When
Created 23 years ago (July 26, 2002, 9:38 a.m.)
Deposited 1 year, 6 months ago (Feb. 3, 2024, 12:35 a.m.)
Indexed 4 months ago (April 19, 2025, 1:07 a.m.)
Issued 32 years, 3 months ago (May 24, 1993)
Published 32 years, 3 months ago (May 24, 1993)
Published Print 32 years, 3 months ago (May 24, 1993)
Funders 0

None

@article{Miyata_1993, title={Electron transport properties of a strained Si layer on a relaxed Si1−xGex substrate by Monte Carlo simulation}, volume={62}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.109278}, DOI={10.1063/1.109278}, number={21}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Miyata, H. and Yamada, Toshishige and Ferry, D. K.}, year={1993}, month=may, pages={2661–2663} }