Abstract
Room-temperature photoluminescence (PL) from Si chemically etched (CE) in HF-HNO3-based solution has been observed. Scanning electron microscopy reveals that the etched Si has a surface morphology similar to that of luminescent porous Si fabricated by conventional anodization. PL spectra show an order of magnitude smaller luminescent intensity and a shorter wavelength intensity peak for CE Si. A CE Si thickness limitation was observed. The formation of CE Si can be readily explained by a local anodization model.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:33 a.m.) |
Deposited | 8 months, 3 weeks ago (Dec. 7, 2024, 4:33 p.m.) |
Indexed | 3 weeks ago (Aug. 7, 2025, 4:30 p.m.) |
Issued | 33 years, 4 months ago (April 13, 1992) |
Published | 33 years, 4 months ago (April 13, 1992) |
Published Print | 33 years, 4 months ago (April 13, 1992) |
@article{Shih_1992, title={Photoluminescence and formation mechanism of chemically etched silicon}, volume={60}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.107162}, DOI={10.1063/1.107162}, number={15}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Shih, S. and Jung, K. H. and Hsieh, T. Y. and Sarathy, J. and Campbell, J. C. and Kwong, D. L.}, year={1992}, month=apr, pages={1863–1865} }