DOI: 10.1063/1.106940. Combined shear force and near-field scanning optical microscopy

Combined shear force and near-field scanning optical microscopy

10.1063/1.106940

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

A distance regulation method has been developed to enhance the reliability, versatility, and ease of use of near-field scanning optical microscopy (NSOM). The method relies on the detection of shear forces between the end of a near-field probe and the sample of interest. The system can be used solely for distance regulation in NSOM, for simultaneous shear force and near-field imaging, or for shear force microscopy alone. In the latter case, uncoated optical fiber probes are found to yield images with consistently high resolution.

Bibliography

Betzig, E., Finn, P. L., & Weiner, J. S. (1992). Combined shear force and near-field scanning optical microscopy. Applied Physics Letters, 60(20), 2484â2486.

Authors 3

E. Betzig (first)
P. L. Finn (additional)
J. S. Weiner (additional)

References 17 Referenced 826

10.1126/science.251.5000.1468 / Science (1991)
{'key': '2024020303593651800_r2'}
10.1063/1.336848 / J. Appl. Phys. (1986)
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10.1103/PhysRevB.39.767 / Phys. Rev. B (1989)
10.1016/0030-4018(89)90297-6 / Opt. Commun. (1989)
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10.1016/0304-3991(91)90163-Z / Ultramicroscopy (1991)
10.1103/PhysRevLett.56.930 / Phys. Rev. Lett. (1986)
10.1063/1.338807 / J. Appl. Phys. (1987)
10.1063/1.1142244 / Rev. Sci. Instrum. (1991)
{'key': '2024020303593651800_r14'}
10.1116/1.575440 / J. Vac. Sci. Technol. A (1988)
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10.1063/1.1142243 / Rev. Sci. Instrum. (1991)

Dates

Type	When
Created	23 years ago (July 26, 2002, 9:33 a.m.)
Deposited	1 year, 6 months ago (Feb. 2, 2024, 10:59 p.m.)
Indexed	2 weeks, 2 days ago (Aug. 6, 2025, 9:21 a.m.)
Issued	33 years, 3 months ago (May 18, 1992)
Published	33 years, 3 months ago (May 18, 1992)
Published Print	33 years, 3 months ago (May 18, 1992)

Funders 0

None

BibTeX

@article{Betzig_1992, title={Combined shear force and near-field scanning optical microscopy}, volume={60}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.106940}, DOI={10.1063/1.106940}, number={20}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Betzig, E. and Finn, P. L. and Weiner, J. S.}, year={1992}, month=may, pages={2484–2486} }

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