Abstract
We present the design and describe the operation of a scanning probe microscope which simultaneously provides the attractive mode force and near-field optical images of objects. In this technique, the force signal is used to track the topography, thus allowing the optical signal primarily to show variations in transmissivity. A number of results are presented on the application of the technique to imaging different samples.
References
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Dates
Type | When |
---|---|
Created | 23 years ago (July 26, 2002, 8:49 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 2, 2024, 11:08 p.m.) |
Indexed | 2 weeks, 2 days ago (Aug. 6, 2025, 8:02 a.m.) |
Issued | 33 years, 2 months ago (June 15, 1992) |
Published | 33 years, 2 months ago (June 15, 1992) |
Published Print | 33 years, 2 months ago (June 15, 1992) |
@article{Toledo_Crow_1992, title={Near-field differential scanning optical microscope with atomic force regulation}, volume={60}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.106801}, DOI={10.1063/1.106801}, number={24}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Toledo-Crow, R. and Yang, P. C. and Chen, Y. and Vaez-Iravani, M.}, year={1992}, month=jun, pages={2957–2959} }