DOI: 10.1063/1.105649. Limits of imaging resolution for atomic force microscopy of molecules

Limits of imaging resolution for atomic force microscopy of molecules

10.1063/1.105649

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

The imaging resolution of an atomic force microscope operating in contact with a Langmuir–Blodgett (LB) film is predicted as a function of applied force, tip radius, adhesive force, and tip and film properties. The elastic modulus and the hardness of the LB film were measured using a nanoindenter and the imaging resolution is predicted using both a simple Hertzian elastic analysis and one that includes adhesive forces between the tip and the sample. For a small applied force (&lt;1 nN) the resolution improves sharply as the tip radius and the adhesive force decrease. The onset of inelastic deformation, however, limits the resolution of the sharpest tips.

Bibliography

Weihs, T. P., Nawaz, Z., Jarvis, S. P., & Pethica, J. B. (1991). Limits of imaging resolution for atomic force microscopy of molecules. Applied Physics Letters, 59(27), 3536â3538.

Authors 4

T. P. Weihs (first)
Z. Nawaz (additional)
S. P. Jarvis (additional)
J. B. Pethica (additional)

References 26 Referenced 107

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Dates

Type	When
Created	23 years ago (July 26, 2002, 8:42 a.m.)
Deposited	1 year, 6 months ago (Feb. 2, 2024, 10:25 p.m.)
Indexed	4 months, 2 weeks ago (April 2, 2025, 9:23 p.m.)
Issued	33 years, 7 months ago (Dec. 30, 1991)
Published	33 years, 7 months ago (Dec. 30, 1991)
Published Print	33 years, 7 months ago (Dec. 30, 1991)

Funders 0

None

BibTeX

@article{Weihs_1991, title={Limits of imaging resolution for atomic force microscopy of molecules}, volume={59}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.105649}, DOI={10.1063/1.105649}, number={27}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Weihs, T. P. and Nawaz, Z. and Jarvis, S. P. and Pethica, J. B.}, year={1991}, month=dec, pages={3536–3538} }

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