Abstract
The recently reported carbon-ion-implantation-outdiffusion method [J. F. Prins and H. L. Gaigher, Mater. Res. Soc. Sym. Proc. (to be published, 1991)] of growing epitaxial diamond layers on copper was carefully examined. X-ray diffraction, Raman scattering, and transmission electron diffraction characterization of films prepared by implanting 200 keV carbon ions into (100), (110), (111), and (210) copper, held at temperatures of 850–1000 °C, showed that the films were invariably highly oriented crystalline graphite. No evidence has been found to support the claim that diamond was formed by this implantation-outdiffusion method.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:33 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 2, 2024, 9:45 p.m.) |
Indexed | 11 months, 2 weeks ago (Sept. 13, 2024, 12:39 p.m.) |
Issued | 34 years ago (Aug. 12, 1991) |
Published | 34 years ago (Aug. 12, 1991) |
Published Print | 34 years ago (Aug. 12, 1991) |
@article{Lee_1991, title={Heteroepitaxy of carbon on copper by high-temperature ion implantation}, volume={59}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.105342}, DOI={10.1063/1.105342}, number={7}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Lee, S.-Tong and Chen, Samuel and Braunstein, G. and Feng, X. and Bello, I. and Lau, W. M.}, year={1991}, month=aug, pages={785–787} }