Abstract
Scanning tunneling microscopy (STM) has been made on an as-prepared Si(111) surface by the 1%-HF treatment. The STM images for both the empty and filled states exhibit regular dots with the threefold symmetry on the flat parts of the surface: the distance between dots measures 2.2 Å. The origin of these dots can be ascribed to the H atoms of the trihydride (SiH3) phase on the Si(111) surface. The electrons can tunnel from or to the tail states of the σ (filled) states or the σ* (empty) states around the H atoms for the SiH3 radicals, respectively.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:31 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 2, 2024, 9:55 p.m.) |
Indexed | 1 year, 7 months ago (Feb. 4, 2024, 12:20 p.m.) |
Issued | 33 years, 11 months ago (Sept. 9, 1991) |
Published | 33 years, 11 months ago (Sept. 9, 1991) |
Published Print | 33 years, 11 months ago (Sept. 9, 1991) |
@article{Morita_1991, title={Direct observation of SiH3 on a 1%-HF-treated Si(111) surface by scanning tunneling microscopy}, volume={59}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.105304}, DOI={10.1063/1.105304}, number={11}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Morita, Y. and Miki, K. and Tokumoto, H.}, year={1991}, month=sep, pages={1347–1349} }