Abstract
The electronic transport properties and structural morphology of fast-pulse excimer-laser- crystallized hydrogenated amorphous silicon (a-Si:H) thin films have been measured. The room-temperature dark dc conductivities and Hall mobilities increase by several orders of magnitude at well-defined laser energy density thresholds which decrease as the impurity concentration in the films increases. The structural morphology of the films suggests an impurity-induced reduction of the a-Si:H melt temperature as the origin of this behavior.
References
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 8:51 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 2, 2024, 8:41 p.m.) |
Indexed | 1 year, 7 months ago (Feb. 3, 2024, 12:01 p.m.) |
Issued | 34 years, 9 months ago (Nov. 19, 1990) |
Published | 34 years, 9 months ago (Nov. 19, 1990) |
Published Print | 34 years, 9 months ago (Nov. 19, 1990) |
@article{Winer_1990, title={Excimer-laser-induced crystallization of hydrogenated amorphous silicon}, volume={57}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.103897}, DOI={10.1063/1.103897}, number={21}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Winer, K. and Anderson, G. B. and Ready, S. E. and Bachrach, R. Z. and Johnson, R. I. and Ponce, F. A. and Boyce, J. B.}, year={1990}, month=nov, pages={2222–2224} }