Abstract
Using a source of freely propagating subpicosecond pulses of THz radiation, we have measured the absorption and dispersion of both N- and P-type, 1 Ω cm silicon from 0.1 to 2 THz. These results give the corresponding frequency-dependent complex conductance over the widest frequency range to date. The data provide a complete view on the dynamics of both electrons and holes and are well fit by the simple Drude relationship.
References
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:02 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 2, 2024, 7:56 p.m.) |
Indexed | 3 weeks, 5 days ago (Aug. 7, 2025, 4:32 p.m.) |
Issued | 35 years, 4 months ago (April 23, 1990) |
Published | 35 years, 4 months ago (April 23, 1990) |
Published Print | 35 years, 4 months ago (April 23, 1990) |
@article{van_Exter_1990, title={Optical and electronic properties of doped silicon from 0.1 to 2 THz}, volume={56}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.103120}, DOI={10.1063/1.103120}, number={17}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={van Exter, Martin and Grischkowsky, D.}, year={1990}, month=apr, pages={1694–1696} }