Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

Using a source of freely propagating subpicosecond pulses of THz radiation, we have measured the absorption and dispersion of both N- and P-type, 1 Ω cm silicon from 0.1 to 2 THz. These results give the corresponding frequency-dependent complex conductance over the widest frequency range to date. The data provide a complete view on the dynamics of both electrons and holes and are well fit by the simple Drude relationship.

Bibliography

van Exter, M., & Grischkowsky, D. (1990). Optical and electronic properties of doped silicon from 0.1 to 2 THz. Applied Physics Letters, 56(17), 1694–1696.

Authors 2
  1. Martin van Exter (first)
  2. D. Grischkowsky (additional)
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Dates
Type When
Created 23 years, 1 month ago (July 26, 2002, 9:02 a.m.)
Deposited 1 year, 7 months ago (Feb. 2, 2024, 7:56 p.m.)
Indexed 3 weeks, 5 days ago (Aug. 7, 2025, 4:32 p.m.)
Issued 35 years, 4 months ago (April 23, 1990)
Published 35 years, 4 months ago (April 23, 1990)
Published Print 35 years, 4 months ago (April 23, 1990)
Funders 0

None

@article{van_Exter_1990, title={Optical and electronic properties of doped silicon from 0.1 to 2 THz}, volume={56}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.103120}, DOI={10.1063/1.103120}, number={17}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={van Exter, Martin and Grischkowsky, D.}, year={1990}, month=apr, pages={1694–1696} }