Abstract
Light produced by a laser plasma light source (LPLS) is used to perform optical reflectivity measurements on single crystals from 5 to 40 eV in a single experiment. The intense continuum generated by the rare-earth plasma allows a significantly higher resolution above 15 eV and extends the measurements to higher energies than those attainable with other laboratory based light sources. This is the first application of a LPLS to vacuum ultraviolet spectroscopy of solids and we demonstrate this capability on two insulating materials, α-Al2O3 and MgAl2O4.
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Dates
Type | When |
---|---|
Created | 23 years ago (July 26, 2002, 8:51 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 2, 2024, 7:20 p.m.) |
Indexed | 2 weeks, 5 days ago (Aug. 2, 2025, 1:20 a.m.) |
Issued | 35 years, 9 months ago (Nov. 6, 1989) |
Published | 35 years, 9 months ago (Nov. 6, 1989) |
Published Print | 35 years, 9 months ago (Nov. 6, 1989) |
@article{Bortz_1989, title={Optical reflectivity measurements using a laser plasma light source}, volume={55}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.102335}, DOI={10.1063/1.102335}, number={19}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Bortz, M. L. and French, R. H.}, year={1989}, month=nov, pages={1955–1957} }