Abstract
The director configuration in a thin layer of ferroelectric liquid crystal (FLC) under an applied static field is investigated by exciting optic modes in a FLC cell. The reflectivity data obtained may only be fitted to theory by maintaining in the voltage-distorted optical tensor profile a point in the middle of the cell having the same structure as at 0 V. This unambiguously confirms the chevron structure observed in x-ray diffraction and shows that the layering remains largely undistorted to fields of order 3×106 V m−1.
References
7
Referenced
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 8:51 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 2, 2024, 7:14 p.m.) |
Indexed | 1 year, 6 months ago (Feb. 7, 2024, 4:04 p.m.) |
Issued | 35 years, 10 months ago (Oct. 16, 1989) |
Published | 35 years, 10 months ago (Oct. 16, 1989) |
Published Print | 35 years, 10 months ago (Oct. 16, 1989) |
@article{Elston_1989, title={Characterization of reorientation of a thin layer of ferroelectric liquid-crystal material under an applied field by excitation of optical modes}, volume={55}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.102217}, DOI={10.1063/1.102217}, number={16}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Elston, S. J. and Sambles, J. R.}, year={1989}, month=oct, pages={1621–1623} }