Abstract
We have analyzed the structure of tilted superlattices on atomically stepped surfaces by using atomic force microscopy to detect ridges of GaAs formed by the selective oxidation and removal of intervening AlAs regions. Oxides were removed in a liquid cell of the atomic force microscope while scanning. We have demonstrated plan views which reveal the superlattice length and width uniformity, but the method is also in principle suited for cross-sectional samples.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:05 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 2, 2024, 7:25 p.m.) |
Indexed | 1 year, 6 months ago (Feb. 7, 2024, 2:43 p.m.) |
Issued | 35 years, 8 months ago (Dec. 11, 1989) |
Published | 35 years, 8 months ago (Dec. 11, 1989) |
Published Print | 35 years, 8 months ago (Dec. 11, 1989) |
@article{Chalmers_1989, title={Determination of tilted superlattice structure by atomic force microscopy}, volume={55}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.102008}, DOI={10.1063/1.102008}, number={24}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Chalmers, S. A. and Gossard, A. C. and Weisenhorn, A. L. and Gould, S. A. C. and Drake, B. and Hansma, P. K.}, year={1989}, month=dec, pages={2491–2493} }