Crossref
journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract
We show that a new concept of amphoteric native defects with strongly Fermi level dependent defect formation energy provides the basis for a unified explanation of a large variety of phenomena in semiconductors. Formation of Schottky barriers, particle irradiation induced compensation, doping-induced superlattice intermixing, and limits of free-carrier concentration find for the first time a common simple explanation.
References
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 8:51 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 2, 2024, 6:41 p.m.) |
Indexed | 1 month ago (July 30, 2025, 9:54 a.m.) |
Issued | 36 years, 3 months ago (May 22, 1989) |
Published | 36 years, 3 months ago (May 22, 1989) |
Published Print | 36 years, 3 months ago (May 22, 1989) |
@article{Walukiewicz_1989, title={Amphoteric native defects in semiconductors}, volume={54}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.101174}, DOI={10.1063/1.101174}, number={21}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Walukiewicz, W.}, year={1989}, month=may, pages={2094–2096} }