DOI: 10.1063/1.100851. Lateral forces and topography using scanning tunneling microscopy with optical sensing of the tip position

Lateral forces and topography using scanning tunneling microscopy with optical sensing of the tip position

10.1063/1.100851

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

A technique is described for measurement of lateral forces on a scanning tunneling microscopy (STM) tip simultaneously with surface topography, using optical sensing of the STM tip vibration. The STM tip is caused to vibrate near a resonant mode in the lateral direction, using the capacitive forces between the tip and the surface under study. Topography is monitored using the z-displacement feedback voltage, in a low-frequency loop, while optical sensing of the high-frequency tip vibration amplitude monitors lateral forces acting on the tip.

Bibliography

Taubenblatt, M. A. (1989). Lateral forces and topography using scanning tunneling microscopy with optical sensing of the tip position. Applied Physics Letters, 54(9), 801â803.

Authors 1

Marc A. Taubenblatt (first)

References 9 Referenced 7

10.1103/PhysRevLett.50.120 / Phys. Rev. Lett. (1983)
10.1103/PhysRevLett.56.930 / Phys. Rev. Lett. (1986)
10.1063/1.338807 / J. Appl. Phys. (1987)
{'key': '2024020223213670500_r4', 'first-page': '1307', 'volume': '6', 'year': '1987', 'journal-title': 'Rev. Prog. Quant. NDE'} / Rev. Prog. Quant. NDE (1987)
10.1103/PhysRevLett.59.1942 / Phys. Rev. Lett. (1987)
10.1103/PhysRevLett.57.2403 / Phys. Rev. Lett. (1986)
10.1063/1.99224 / Appl. Phys. Lett. (1988)
10.1063/1.100061 / Appl. Phys. Lett. (1988)
{'key': '2024020223213670500_r9'}

Dates

Type	When
Created	23 years ago (July 26, 2002, 8:51 a.m.)
Deposited	1 year, 6 months ago (Feb. 2, 2024, 6:29 p.m.)
Indexed	1 year, 6 months ago (Feb. 4, 2024, 10:59 a.m.)
Issued	36 years, 5 months ago (Feb. 27, 1989)
Published	36 years, 5 months ago (Feb. 27, 1989)
Published Print	36 years, 5 months ago (Feb. 27, 1989)

Funders 0

None

BibTeX

@article{Taubenblatt_1989, title={Lateral forces and topography using scanning tunneling microscopy with optical sensing of the tip position}, volume={54}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.100851}, DOI={10.1063/1.100851}, number={9}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Taubenblatt, Marc A.}, year={1989}, month=feb, pages={801–803} }

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