DOI: 10.1049/pi-2.1953.0095. An improved scanning electron microscope for opaque specimens

An improved scanning electron microscope for opaque specimens

10.1049/pi-2.1953.0095

Crossref journal-article

Institution of Engineering and Technology (IET)

Proceedings of the IEE - Part II: Power Engineering (265)

Bibliography

McMullan, D. (1953). An improved scanning electron microscope for opaque specimens. Proceedings of the IEE - Part II: Power Engineering, 100(75), 245â256.

Authors 1

D. McMullan (first)

References 0 Referenced 15

None

Dates

Type	When
Created	11 years, 7 months ago (Jan. 22, 2014, 1:08 a.m.)
Deposited	4 years, 7 months ago (Jan. 1, 2021, 8:23 a.m.)
Indexed	2 months ago (June 25, 2025, 10:26 p.m.)
Issued	72 years, 2 months ago (June 1, 1953)
Published	72 years, 2 months ago (June 1, 1953)
Published Print	72 years, 2 months ago (June 1, 1953)

Funders 0

None

BibTeX

@article{McMullan_1953, title={An improved scanning electron microscope for opaque specimens}, volume={100}, ISSN={2054-0639}, url={http://dx.doi.org/10.1049/pi-2.1953.0095}, DOI={10.1049/pi-2.1953.0095}, number={75}, journal={Proceedings of the IEE - Part II: Power Engineering}, publisher={Institution of Engineering and Technology (IET)}, author={McMullan, D.}, year={1953}, month=jun, pages={245–256} }

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