Crossref journal-article
Wiley
Journal of Microscopy (311)
Abstract

Electron energy loss spectroscopy was used to observe the segregation of Al on a Si surface above the melting point of Al. A mixture of Al and Si particles was heated above the melting point of Al in a vacuum of 1 × 10−5 Pa. The Si surface, which initially had been covered with an amorphous oxide layer before heating, became clean and atomically facetted when the Al melted. It was shown that the Si surface was segregated with Al.

Bibliography

Tsukimoto, S., Arai, S., Konno, M., Kamino, T., Sasaki, K., & Saka, H. (2001). In situ high resolution electron microscopy/electron energy loss spectroscopy observation of wetting of a Si surface by molten Al. Journal of Microscopy, 203(1), 17–21. Portico.

Authors 6
  1. S. Tsukimoto (first)
  2. S. Arai (additional)
  3. M. Konno (additional)
  4. T. Kamino (additional)
  5. K. Sasaki (additional)
  6. H. Saka (additional)
Dates
Type When
Created 22 years, 5 months ago (March 12, 2003, 1:31 a.m.)
Deposited 1 year, 10 months ago (Oct. 18, 2023, 8:27 a.m.)
Indexed 1 year, 10 months ago (Oct. 19, 2023, 1:18 a.m.)
Issued 24 years, 1 month ago (July 1, 2001)
Published 24 years, 1 month ago (July 1, 2001)
Published Online 23 years, 8 months ago (Dec. 21, 2001)
Published Print 24 years, 1 month ago (July 1, 2001)
Funders 0

None

@article{Tsukimoto_2001, title={In situ high resolution electron microscopy/electron energy loss spectroscopy observation of wetting of a Si surface by molten Al}, volume={203}, ISSN={1365-2818}, url={http://dx.doi.org/10.1046/j.1365-2818.2001.00905.x}, DOI={10.1046/j.1365-2818.2001.00905.x}, number={1}, journal={Journal of Microscopy}, publisher={Wiley}, author={Tsukimoto, S. and Arai, S. and Konno, M. and Kamino, T. and Sasaki, K. and Saka, H.}, year={2001}, month=jul, pages={17–21} }