Abstract
Near‐field optical second harmonic microscopy has been applied to imaging of the c/a/c/a polydomain structure of epitaxial PbZrxTi1–xO3 thin films in the 0 < x < 0.4 range. Comparison of the near‐field optical images and the results of atomic force microscopy and X‐ray diffraction studies show that an optical resolution of the order of 100 nm is achieved. Symmetry properties of the near‐field second harmonic signal allow us to obtain good optical contrast between the local second harmonic generation in c‐ and a‐domains. Experimentally measured near‐field second harmonic images have been compared with the results of theoretical calculations. Good agreement between theory and experiment is demonstrated.
References
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Dates
Type | When |
---|---|
Created | 22 years, 5 months ago (March 12, 2003, 1:31 a.m.) |
Deposited | 1 year, 10 months ago (Oct. 18, 2023, 3:27 a.m.) |
Indexed | 1 year, 10 months ago (Oct. 19, 2023, 12:19 a.m.) |
Issued | 24 years, 4 months ago (April 1, 2001) |
Published | 24 years, 4 months ago (April 1, 2001) |
Published Online | 23 years, 8 months ago (Dec. 21, 2001) |
Published Print | 24 years, 4 months ago (April 1, 2001) |
@article{Smolyaninov_2001, title={Near‐field second harmonic imaging of the c/a/c/a polydomain structure of epitaxial PbZrxTi1–xO3 thin films}, volume={202}, ISSN={1365-2818}, url={http://dx.doi.org/10.1046/j.1365-2818.2001.00885.x}, DOI={10.1046/j.1365-2818.2001.00885.x}, number={1}, journal={Journal of Microscopy}, publisher={Wiley}, author={Smolyaninov, I. I. and Liang, H. Y. and Lee, C. H. and Davis, C. C. and Nagarajan, V. and Ramesh, R.}, year={2001}, month=apr, pages={250–254} }