DOI: 10.1046/j.1365-2818.1998.3100866.x. Sensitivity limits of strain mapping procedures using high‐resolution electron microscopy

Sensitivity limits of strain mapping procedures using high‐resolution electron microscopy

10.1046/j.1365-2818.1998.3100866.x

Crossref journal-article

Wiley

Journal of Microscopy (311)

Abstract

Strain detection limits achieved by several approaches of strain mapping differing in the procedure of determining positions of intensity maxima have been compared. Algorithms which simultaneously take into account the two‐dimensional intensity distribution around maximum positions yield similar detection limits and are superior to those performing successive one‐dimensional cuts. Investigations of the effect of image recording imply that the use of photographic plates is superior to direct image recording using a slow‐scan CCD camera because of larger sampling rates and a larger field of view. It is finally shown that the choice of specimen preparation technique substantially affects the strain detection limit with cleaved samples yielding results which are a factor of about three better than ion‐milled samples.

Bibliography

Seitz, H., Ahlborn, K., Seibt, M., & SchrÃ¶ter, W. (1998). Sensitivity limits of strain mapping procedures using highâresolution electron microscopy. Journal of Microscopy, 190(1â2), 184â189. Portico.

Authors 4

H. Seitz (first)
K. Ahlborn (additional)
M. Seibt (additional)
W. Schröter (additional)

References 21 Referenced 22

10.1051/mmm:0199200304036300
10.1016/0304-3991(94)90149-X
10.1016/0304-3991(93)90234-O
10.1557/PROC-82-109
10.1103/PhysRevLett.72.3198
10.1143/JJAP.33.1228
10.1063/1.356641
{'key': 'e_1_2_8_9_2', 'first-page': '129', 'article-title': 'Quantitative analysis of atomic displacements in HRTEM images', 'volume': '6', 'author': 'Kilaas R.', 'year': '1994', 'journal-title': 'J. Computer-Assist. Microsc.'} / J. Computer-Assist. Microsc. / Quantitative analysis of atomic displacements in HRTEM images by Kilaas R. (1994)
10.1016/0304-3991(95)00085-2
10.1016/0304-3991(93)90194-3
10.1016/0304-3991(94)00200-7
{'key': 'e_1_2_8_13_2', 'first-page': '63', 'article-title': 'Digital analysis of high resolution transmission electron microscopy lattice images', 'volume': '102', 'author': 'Rosenauer A.', 'year': '1996', 'journal-title': 'Optik'} / Optik / Digital analysis of high resolution transmission electron microscopy lattice images by Rosenauer A. (1996)
10.1016/0022-0248(95)00083-6
10.1016/0304-3991(92)90223-7
10.1046/j.1365-2818.1996.139420.x
Seitz H.(1992)Chemische‐ und Verzerrungsanalyse mit nahezu atomarer Auflösung in der hochauflösenden Elektronenmikroskopie. Diploma Thesis Göttingen (in German).
Seitz H.(1996)Messung tetragonaler Verzerrung in Halbleiter‐Heterostrukturen mit quasi‐atomarer Auflösung. Thesis Göttingen (Cuvillier‐Verlag Göttingen ISBN 3‐89588‐734‐X) (in German).
10.1002/pssa.2211500206
10.1016/0304-3991(93)90035-V
10.1103/PhysRevB.40.9802
10.1116/1.583473

Dates

Type	When
Created	22 years, 5 months ago (March 12, 2003, 1:26 a.m.)
Deposited	1 year, 11 months ago (Sept. 1, 2023, 4:33 p.m.)
Indexed	3 weeks, 5 days ago (July 28, 2025, 5:42 p.m.)
Issued	27 years, 4 months ago (April 1, 1998)
Published	27 years, 4 months ago (April 1, 1998)
Published Online	23 years, 1 month ago (July 10, 2002)
Published Print	27 years, 4 months ago (April 1, 1998)

Funders 0

None

BibTeX

@article{Seitz_1998, title={Sensitivity limits of strain mapping procedures using high‐resolution electron microscopy}, volume={190}, ISSN={1365-2818}, url={http://dx.doi.org/10.1046/j.1365-2818.1998.3100866.x}, DOI={10.1046/j.1365-2818.1998.3100866.x}, number={1–2}, journal={Journal of Microscopy}, publisher={Wiley}, author={Seitz, H. and Ahlborn, K. and Seibt, M. and Schröter, W.}, year={1998}, month=apr, pages={184–189} }

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