DOI: 10.1046/j.1365-2818.1996.1400698.x. <b>MULTIVARIATE STATISTICAL ANALYSIS OF FEG‐STEM EDX SPECTRA</b>

MULTIVARIATE STATISTICAL ANALYSIS OF FEG‐STEM EDX SPECTRA

10.1046/j.1365-2818.1996.1400698.x

Crossref journal-article

Wiley

Journal of Microscopy (311)

Abstract

A multivariate statistical analysis method has been used to examine the information content of a series of EDX spectra acquired using a FEG‐STEM recorded across a segregated grain boundary in a ferritic steel. The spectra have been factored into a set of orthogonal information components (eigenspectra), each of which corresponds to an independent source of information. Two meaningful eigenspectra are identified: one is related to the segregation of P and Cr and the other to a combination of self‐absorption and coherent bremsstrahlung. Spectra are reconstructed from the meaningful eigenspectra to reduce noise and improve the sensitivity for detection of trace element segregation.

Bibliography

Titchmarsh, J. M., & Dumbill, S. (1996). MULTIVARIATE STATISTICAL ANALYSIS OF FEGâSTEM EDX SPECTRA. Journal of Microscopy, 184(3), 195â207. Portico.

Authors 2

J. M. Titchmarsh (first)
S. Dumbill (additional)

References 0 Referenced 52

None

Dates

Type	When
Created	21 years, 9 months ago (Nov. 2, 2003, 11:37 a.m.)
Deposited	1 year, 9 months ago (Oct. 26, 2023, 9:16 p.m.)
Indexed	4 months ago (April 16, 2025, 7:06 a.m.)
Issued	28 years, 8 months ago (Dec. 1, 1996)
Published	28 years, 8 months ago (Dec. 1, 1996)
Published Online	21 years, 9 months ago (Oct. 31, 2003)
Published Print	28 years, 8 months ago (Dec. 1, 1996)

Funders 0

None

BibTeX

@article{Titchmarsh_1996, title={MULTIVARIATE STATISTICAL ANALYSIS OF FEG‐STEM EDX SPECTRA}, volume={184}, ISSN={1365-2818}, url={http://dx.doi.org/10.1046/j.1365-2818.1996.1400698.x}, DOI={10.1046/j.1365-2818.1996.1400698.x}, number={3}, journal={Journal of Microscopy}, publisher={Wiley}, author={Titchmarsh, J. M. and Dumbill, S.}, year={1996}, month=dec, pages={195–207} }

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