DOI: 10.1039/c3ja50026h. Elemental mapping of microstructures by scanning electron microscopy-energy dispersive X-ray spectrometry (SEM-EDS): extraordinary advances with the silicon drift detector (SDD)

Elemental mapping of microstructures by scanning electron microscopy-energy dispersive X-ray spectrometry (SEM-EDS): extraordinary advances with the silicon drift detector (SDD)

10.1039/c3ja50026h

Crossref journal-article

Royal Society of Chemistry (RSC)

Journal of Analytical Atomic Spectrometry (292)

Bibliography

Newbury, D. E., & Ritchie, N. W. M. (2013). Elemental mapping of microstructures by scanning electron microscopy-energy dispersive X-ray spectrometry (SEM-EDS): extraordinary advances with the silicon drift detector (SDD). Journal of Analytical Atomic Spectrometry, 28(7), 973.

Authors 2

Dale E. Newbury (first)
Nicholas W. M. Ritchie (additional)

References 10 Referenced 73

10.1038/1771172b0 / Nature by Cosslett (1956)
10.1126/science.159.3814.528 / Science by Fitzgerald (1968)
10.1046/j.1365-2818.1999.00437.x / J. Microsc. by Mott (1999)
{'key': 'c3ja50026h-(cit7)/*[position()=1]', 'first-page': '11', 'volume': '15', 'author': 'Struder', 'year': '1998', 'journal-title': 'Mikrochim. Acta, Suppl.'} / Mikrochim. Acta, Suppl. by Struder (1998)
10.1017/S1431927606060673 / Microsc. Microanal. by Newbury (2006)
10.1017/S1431927612001109 / Microsc. Microanal. by Ritchie (2012)
10.1002/sca.4950270104 / Scanning by Newbury (2005)
10.1111/j.0022-2720.2004.01412.x / J. Microsc. by Bright (2004)
10.1017/S1431927699000161 / Microsc. Microanal. by Newbury (1999)
10.1017/S1431927611000183 / Microsc. Microanal. by Davis (2011)

Dates

Type	When
Created	12 years, 4 months ago (April 19, 2013, 8:30 a.m.)
Deposited	1 year, 4 months ago (April 17, 2024, 11:40 a.m.)
Indexed	3 weeks, 5 days ago (July 26, 2025, 4:57 a.m.)
Issued	12 years, 7 months ago (Jan. 1, 2013)
Published	12 years, 7 months ago (Jan. 1, 2013)
Published Print	12 years, 7 months ago (Jan. 1, 2013)

Funders 0

None

BibTeX

@article{Newbury_2013, title={Elemental mapping of microstructures by scanning electron microscopy-energy dispersive X-ray spectrometry (SEM-EDS): extraordinary advances with the silicon drift detector (SDD)}, volume={28}, ISSN={1364-5544}, url={http://dx.doi.org/10.1039/c3ja50026h}, DOI={10.1039/c3ja50026h}, number={7}, journal={Journal of Analytical Atomic Spectrometry}, publisher={Royal Society of Chemistry (RSC)}, author={Newbury, Dale E. and Ritchie, Nicholas W. M.}, year={2013}, pages={973} }

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