Piezoresponse force microscopy and nanoferroic phenomena
10.1038/s41467-019-09650-8
Crossref journal-article
Springer Science and Business Media LLC
Nature Communications (297)
Abstract

AbstractSince its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of the mainstream techniques in the field of nanoferroic materials. This review describes the evolution of PFM from an imaging technique to a set of advanced methods, which have played a critical role in launching new areas of ferroic research, such as multiferroic devices and domain wall nanoelectronics. The paper reviews the impact of advanced PFM modes concerning the discovery and scientific understanding of novel nanoferroic phenomena and discusses challenges associated with the correct interpretation of PFM data. In conclusion, it offers an outlook for future trends and developments in PFM.

Bibliography

Gruverman, A., Alexe, M., & Meier, D. (2019). Piezoresponse force microscopy and nanoferroic phenomena. Nature Communications, 10(1).

Authors 3
  1. Alexei Gruverman (first)
  2. Marin Alexe (additional)
  3. Dennis Meier (additional)
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Dates
Type When
Created 6 years, 4 months ago (April 10, 2019, 6:18 a.m.)
Deposited 2 years, 8 months ago (Dec. 16, 2022, 5:28 p.m.)
Indexed 1 day, 23 hours ago (Aug. 21, 2025, 1:01 p.m.)
Issued 6 years, 4 months ago (April 10, 2019)
Published 6 years, 4 months ago (April 10, 2019)
Published Online 6 years, 4 months ago (April 10, 2019)
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@article{Gruverman_2019, title={Piezoresponse force microscopy and nanoferroic phenomena}, volume={10}, ISSN={2041-1723}, url={http://dx.doi.org/10.1038/s41467-019-09650-8}, DOI={10.1038/s41467-019-09650-8}, number={1}, journal={Nature Communications}, publisher={Springer Science and Business Media LLC}, author={Gruverman, Alexei and Alexe, Marin and Meier, Dennis}, year={2019}, month=apr }