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Guttmann, P., Bittencourt, C., Rehbein, S., Umek, P., Ke, X., Van Tendeloo, G., Ewels, C. P., & Schneider, G. (2011). Nanoscale spectroscopy with polarized X-rays by NEXAFS-TXM. Nature Photonics, 6(1), 25–29.

Authors 8
  1. Peter Guttmann (first)
  2. Carla Bittencourt (additional)
  3. Stefan Rehbein (additional)
  4. Polona Umek (additional)
  5. Xiaoxing Ke (additional)
  6. Gustaaf Van Tendeloo (additional)
  7. Chris P. Ewels (additional)
  8. Gerd Schneider (additional)
References 30 Referenced 111
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Dates
Type When
Created 13 years, 9 months ago (Nov. 25, 2011, 7:09 a.m.)
Deposited 2 years, 3 months ago (May 18, 2023, 8:03 p.m.)
Indexed 1 month, 2 weeks ago (July 16, 2025, 8:49 a.m.)
Issued 13 years, 9 months ago (Nov. 27, 2011)
Published 13 years, 9 months ago (Nov. 27, 2011)
Published Online 13 years, 9 months ago (Nov. 27, 2011)
Published Print 13 years, 8 months ago (Jan. 1, 2012)
Funders 0

None

@article{Guttmann_2011, title={Nanoscale spectroscopy with polarized X-rays by NEXAFS-TXM}, volume={6}, ISSN={1749-4893}, url={http://dx.doi.org/10.1038/nphoton.2011.268}, DOI={10.1038/nphoton.2011.268}, number={1}, journal={Nature Photonics}, publisher={Springer Science and Business Media LLC}, author={Guttmann, Peter and Bittencourt, Carla and Rehbein, Stefan and Umek, Polona and Ke, Xiaoxing and Van Tendeloo, Gustaaf and Ewels, Chris P. and Schneider, Gerd}, year={2011}, month=nov, pages={25–29} }