DOI: 10.1038/nnano.2007.226. An atomic force microscope tip designed to measure time-varying nanomechanical forces

An atomic force microscope tip designed to measure time-varying nanomechanical forces

10.1038/nnano.2007.226

Crossref journal-article

Springer Science and Business Media LLC

Nature Nanotechnology (297)

Bibliography

Sahin, O., Magonov, S., Su, C., Quate, C. F., & Solgaard, O. (2007). An atomic force microscope tip designed to measure time-varying nanomechanical forces. Nature Nanotechnology, 2(8), 507â514.

Authors 5

Ozgur Sahin (first)
Sergei Magonov (additional)
Chanmin Su (additional)
Calvin F. Quate (additional)
Olav Solgaard (additional)

References 28 Referenced 435

Yamanaka, K., Ogiso, H. & Kolosov, O. Ultrasonic force microscopy for nanometer resolution subsurface imaging. Appl. Phys. Lett. 64, 178–180 (1994). (10.1063/1.111524) / Appl. Phys. Lett. by K Yamanaka (1994)
Maivald, P. et al. Using force modulation to image surface elasticities with the atomic force microscope. Nanotechnology 2, 103 (1991). (10.1088/0957-4484/2/2/004) / Nanotechnology by P Maivald (1991)
Ge, S. et al. Shear modulation force microscopy study of near surface glass transition temperatures. Phys. Rev. Lett. 85, 2340–2343 (2000). (10.1103/PhysRevLett.85.2340) / Phys. Rev. Lett. by S Ge (2000)
Dinelli, F., Buenviaje, C. & Overney, R. M. Glass transition measurements on heterogeneous surfaces. Thin Solid Films 396, 138–144 (2001). (10.1016/S0040-6090(01)01190-7) / Thin Solid Films by F Dinelli (2001)
Oliver, W. C. & Pharr, G. M. An improved technique for determining hardness and elastic-modulus using load and displacement sensing indentation experiments. J. Mater. Res. 7, 1564–1583 (1992). (10.1557/JMR.1992.1564) / J. Mater. Res. by WC Oliver (1992)
Vanlandingham, M. R. et al. Nanoscale indentation of polymer systems using the atomic force microscope. J. Adhesion 64, 31–59 (1997). (10.1080/00218469708010531) / J. Adhesion by MR Vanlandingham (1997)
Zhong, Q., Inniss, D., Kjoller, K. & Elings, V. B. Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy. Surf. Sci. 280, L688–L692 (1993). / Surf. Sci. by Q Zhong (1993)
Klinov, D. & Magonov, S. True molecular resolution in tapping-mode atomic force microscopy with high-resolution probes. Appl. Phys. Lett. 84, 2697–2699 (2004). (10.1063/1.1697629) / Appl. Phys. Lett. by D Klinov (2004)
Cleveland, J. P., Anczykowski, B., Schmid, A. E. & Elings V. B. Energy dissipation in tapping-mode atomic force microscopy. Appl. Phys. Lett. 72, 2613–2615 (1998). (10.1063/1.121434) / Appl. Phys. Lett. by JP Cleveland (1998)
Paulo, A. S. & Garcia, R. Unifying theory of tapping-mode atomic force microscope Phys. Rev B. 66, 041406 (2002).
Hillenbrand, R., Stark, M. & Guckenberger, R. Higher-harmonics generation in tapping-mode atomic-force microscopy: Insights into the tip–sample interaction. Appl. Phys. Lett. 76, 3478–3480 (2000). (10.1063/1.126683) / Appl. Phys. Lett. by R Hillenbrand (2000)
Stark, R. W. & Heckl, W. M. Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation. Surf. Sci. 457, 219–228 (2000). (10.1016/S0039-6028(00)00378-2) / Surf. Sci. by RW Stark (2000)
Crittenden, S., Raman, A. & Reifenberger, R. Probing attractive forces at the nanoscale using higher-harmonic dynamic force microscopy. Phys. Rev. B 72, 235422 (2005). (10.1103/PhysRevB.72.235422) / Phys. Rev. B by S Crittenden (2005)
Legleiter, J., Park, M., Cusick, B. & Kowalewski, T. Scanning probe acceleration microscopy (SPAM) in fluids: mapping mechanical properties of surfaces at the nanoscale. Proc. Natl Acad. Sci. USA 103, 4813–4818 (2006). (10.1073/pnas.0505628103) / Proc. Natl Acad. Sci. USA by J Legleiter (2006)
Hembacher, S., Giessibl, F. J. & Mannhart, J. Force microscopy with light-atom probes. Science 305, 380–383 (2004). (10.1126/science.1099730) / Science by S Hembacher (2004)
Stark, M., Stark, R. W., Heckl, W. M. & Guckenberger, R. Inverting dynamic force microscopy: from signals to time-resolved interaction forces. Proc. Natl Acad. Sci. USA 99, 8473–8478 (2002). (10.1073/pnas.122040599) / Proc. Natl Acad. Sci. USA by M Stark (2002)
Rodriguez, T. R. & Garcia, R. Tip motion in amplitude modulation (tapping-mode) atomic-force microscopy: comparison between continuous and point-mass models. Appl. Phys. Lett. 80, 1646–1648 (2002). (10.1063/1.1456543) / Appl. Phys. Lett. by TR Rodriguez (2002)
Stark, R. W. Optical lever detection in higher eigenmode dynamic atomic force microscopy. Rev. Sci. Instrum. 75, 5053–5055 (2004). (10.1063/1.1808058) / Rev. Sci. Instrum. by RW Stark (2004)
Stark, R. W., Schitter, G., Stark, M., Guckenberger, R. & Stemmer, A. State-space model of freely vibrating and surface-coupled cantilever dynamics in atomic force microscopy. Phys. Rev. B 69, 085412 (2004). (10.1103/PhysRevB.69.085412) / Phys. Rev. B by RW Stark (2004)
Zitzler, L., Herminghaus, S. & Mugele, F. Capillary forces in tapping-mode atomic force microscopy Phys. Rev. B 66, 155436 (2002). (10.1103/PhysRevB.66.155436)
Isrelachvili, J. Intermolecular and Surface Forces (Academic Press, London, 2003). / Intermolecular and Surface Forces by J Isrelachvili (2003)
Luan, B. Q. & Robbins, M. O. The breakdown of continuum models for mechanical contacts. Nature 435, 929–932 (2005). (10.1038/nature03700) / Nature by BQ Luan (2005)
Stark, R. W. & Heckl, W. M. Higher harmonics imaging in tapping-mode atomic-force microscopy. Rev. Sci. Instrum. 74, 5111–5114 (2003). (10.1063/1.1626008) / Rev. Sci. Instrum. by RW Stark (2003)
Sahin, O. et al. High-resolution imaging of elastic properties using harmonic cantilevers. Sensor. Actuat. A 114, 183–190 (2004). (10.1016/j.sna.2003.11.031) / Sensor. Actuat. A by O Sahin (2004)
Sahin, O., Atalar, A., Quate, C. F. & Solgaard, O. Resonant harmonic response in tapping-mode atomic force microscopy. Phys. Rev. B. 69, 165416 (2004). (10.1103/PhysRevB.69.165416) / Phys. Rev. B. by O Sahin (2004)
Garcia, R. et al. Identification of nanoscale dissipation processes by dynamic atomic force microscopy. Phys. Rev. Lett. 97, 016103 (2006). (10.1103/PhysRevLett.97.016103) / Phys. Rev. Lett. by R Garcia (2006)
Ward, I. M. & Sweeney, J. An Introduction to the Mechanical Properties of Solid Polymers (Wiley, Chichester, 2004). / An Introduction to the Mechanical Properties of Solid Polymers by IM Ward (2004)
Dinelli, F., Buenviaje, C. & Overney, R. M. Glass transitions of thin polymeric films: speed and load dependence in lateral force microscopy. J. Chem. Phys. 113, 2043–2048 (2000). (10.1063/1.482012) / J. Chem. Phys. by F Dinelli (2000)

Dates

Type	When
Created	18 years ago (July 29, 2007, 12:58 p.m.)
Deposited	2 years, 3 months ago (May 18, 2023, 8:08 p.m.)
Indexed	3 weeks, 5 days ago (July 26, 2025, 4:53 a.m.)
Issued	18 years ago (July 29, 2007)
Published	18 years ago (July 29, 2007)
Published Online	18 years ago (July 29, 2007)
Published Print	18 years ago (Aug. 1, 2007)

Funders 0

None

BibTeX

@article{Sahin_2007, title={An atomic force microscope tip designed to measure time-varying nanomechanical forces}, volume={2}, ISSN={1748-3395}, url={http://dx.doi.org/10.1038/nnano.2007.226}, DOI={10.1038/nnano.2007.226}, number={8}, journal={Nature Nanotechnology}, publisher={Springer Science and Business Media LLC}, author={Sahin, Ozgur and Magonov, Sergei and Su, Chanmin and Quate, Calvin F. and Solgaard, Olav}, year={2007}, month=jul, pages={507–514} }

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