Crossref
journal-article
Springer Science and Business Media LLC
Nature (297)
References
20
Referenced
792
-
Scherzer, O. The theoretical resolution limit of the electron microscope. J. Appl. Phys. 20, 20–29 (1949)
(
10.1063/1.1698233
) / J. Appl. Phys. by O Scherzer (1949) -
Haider, M., Uhlemann, S., Schwan, E., Kabius, B. & Urban, K. Electron microscopy image enhanced. Nature 392, 768–769 (1998)
(
10.1038/33823
) / Nature by M Haider (1998) -
Crewe, A. V., Isaacson, M. & Johnson, D. A simple scanning electron microscope. Rev. Sci. Instrum. 40, 241–246 (1969)
(
10.1063/1.1683910
) / Rev. Sci. Instrum. by AV Crewe (1969) -
Voyles, P. M., Muller, D. A., Grazul, J. L., Citrin, P. H. & Gossmann, H.-J. L. Atomic-scale imaging of individual dopant atoms and clusters in highly n-doped bulk Si. Nature 416, 826–829 (2002)
(
10.1038/416826a
) / Nature by PM Voyles (2002) -
Crewe, A. V., Wall, J. & Langmore, J. Visibility of a single atom. Science 168, 1338–1340 (1970)
(
10.1126/science.168.3937.1338
) / Science by AV Crewe (1970) -
Pennycook, S. J. & Boatner, L. A. Chemically sensitive structure-imaging with a scanning transmission electron microscope. Nature 336, 565–567 (1988)
(
10.1038/336565a0
) / Nature by SJ Pennycook (1988) -
Xu, P., Kirkland, E. J., Silcox, J. & Keyse, R. High resolution imaging of silicon (111) using a 100 KeV STEM. Ultramicroscopy 32, 93–102 (1990)
(
10.1016/0304-3991(90)90027-J
) / Ultramicroscopy by P Xu (1990) -
Crewe, A. V., Isaacson, M. & Johnson, D. A high resolution electron spectrometer for use in transmission scanning microscopy. Rev. Sci. Instrum. 42, 411–420 (1971)
(
10.1063/1.1685116
) / Rev. Sci. Instrum. by AV Crewe (1971) -
Batson, P. E. Simultaneous STEM imaging and electron-energy-loss-spectroscopy with atomic-column sensitivity. Nature 366, 727–728 (1993)
(
10.1038/366727a0
) / Nature by PE Batson (1993) -
Muller, D. A., Tzou, Y., Raj, R. & Silcox, J. High resolution EELS at grain boundaries. Nature 366, 725–727 (1993)
(
10.1038/366725a0
) / Nature by DA Muller (1993) -
Browning, N. D., Chisholm, M. F. & Pennycook, S. J. Atomic resolution analysis using a scanning transmission electron microscope. Nature 366, 143–146 (1993)
(
10.1038/366143a0
) / Nature by ND Browning (1993) - Dellby, N., Krivanek, O. L., Nellist, P. D., Batson, P. E. & Lupini, A. R. Progress in aberration-corrected scanning transmission electron microscopy. J. Electron. Microsc. 50, 177–185 (2001) / J. Electron. Microsc. by N Dellby (2001)
-
Batson, P. E. Structural and electronic characterization of a dissociated 60° dislocation in GeSi. Phys. Rev. B 61, 16633–16641 (2000)
(
10.1103/PhysRevB.61.16633
) / Phys. Rev. B by PE Batson (2000) -
Ronchi, V. Forty years of history of a grating interferometer. Appl. Opt. 3, 437–450 (1964)
(
10.1364/AO.3.000437
) / Appl. Opt. by V Ronchi (1964) -
Zhang, Z. Y. & Lagally, M. G. Atomistic processes in the early stages of thin film growth. Science 276, 377–383 (1997)
(
10.1126/science.276.5311.377
) / Science by ZY Zhang (1997) -
Kirkland, E. J. Advanced Computing in Electron Microscopy (Plenum, New York, 1998)
(
10.1007/978-1-4757-4406-4
) / Advanced Computing in Electron Microscopy by EJ Kirkland (1998) -
Kawasaki, T. et al. Development of a 1 MV field emission transmission electron microscope. J. Electron. Microsc. 49, 711–718 (2000)
(
10.1093/oxfordjournals.jmicro.a023863
) / J. Electron. Microsc. by T Kawasaki (2000) -
O'Keeffe, M. A. et al. Sub-ångstrom high resolution transmission electron microscopy at 300 keV. Ultramicroscopy 89, 215–241 (2001)
(
10.1016/S0304-3991(01)00094-8
) / Ultramicroscopy by MA O'Keeffe (2001) -
Zuo, J., Kim, Y., O'Keeffe, M. & Spence, J. C. H. Direct observation of d holes and Cu-Cu bonding in Cu2O. Nature 401, 49–56 (1999)
(
10.1038/43403
) / Nature by J Zuo (1999) -
Batson, P. E. Symmetry selected electron energy loss scattering in diamond. Phys. Rev. Lett. 70, 1822–1825 (1993)
(
10.1103/PhysRevLett.70.1822
) / Phys. Rev. Lett. by PE Batson (1993)
Dates
Type | When |
---|---|
Created | 22 years, 11 months ago (Sept. 17, 2002, 8:15 p.m.) |
Deposited | 2 years, 3 months ago (May 18, 2023, 2:09 p.m.) |
Indexed | 25 minutes ago (Aug. 26, 2025, 9:48 p.m.) |
Issued | 23 years ago (Aug. 8, 2002) |
Published | 23 years ago (Aug. 8, 2002) |
Published Print | 23 years ago (Aug. 8, 2002) |
@article{Batson_2002, title={Sub-ångstrom resolution using aberration corrected electron optics}, volume={418}, ISSN={1476-4687}, url={http://dx.doi.org/10.1038/nature00972}, DOI={10.1038/nature00972}, number={6898}, journal={Nature}, publisher={Springer Science and Business Media LLC}, author={Batson, P. E. and Dellby, N. and Krivanek, O. L.}, year={2002}, month=aug, pages={617–620} }