DOI: 10.1021/nn700190t. Real <i>versus</i> Measured Surface Potentials in Scanning Kelvin Probe Microscopy

Real versus Measured Surface Potentials in Scanning Kelvin Probe Microscopy

10.1021/nn700190t

Crossref journal-article

American Chemical Society (ACS)

ACS Nano (316)

Bibliography

Charrier, D. S. H., Kemerink, M., Smalbrugge, B. E., de Vries, T., & Janssen, R. A. J. (2008). Real versus Measured Surface Potentials in Scanning Kelvin Probe Microscopy. ACS Nano, 2(4), 622â626.

Authors 5

Dimitri S. H. Charrier (first)
Martijn Kemerink (additional)
Barry E. Smalbrugge (additional)
Tjibbe de Vries (additional)
René A. J. Janssen (additional)

References 32 Referenced 115

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Dates

Type	When
Created	17 years, 5 months ago (March 20, 2008, 3:01 a.m.)
Deposited	2 years, 5 months ago (March 5, 2023, 1:17 p.m.)
Indexed	1 month, 1 week ago (July 14, 2025, 11:27 p.m.)
Issued	17 years, 5 months ago (March 20, 2008)
Published	17 years, 5 months ago (March 20, 2008)
Published Online	17 years, 5 months ago (March 20, 2008)
Published Print	17 years, 4 months ago (April 1, 2008)

Funders 0

None

BibTeX

@article{Charrier_2008, title={Real versus Measured Surface Potentials in Scanning Kelvin Probe Microscopy}, volume={2}, ISSN={1936-086X}, url={http://dx.doi.org/10.1021/nn700190t}, DOI={10.1021/nn700190t}, number={4}, journal={ACS Nano}, publisher={American Chemical Society (ACS)}, author={Charrier, Dimitri S. H. and Kemerink, Martijn and Smalbrugge, Barry E. and de Vries, Tjibbe and Janssen, René A. J.}, year={2008}, month=mar, pages={622–626} }

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