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Zhang, Y., Ziegler, D., & Salmeron, M. (2013). Charge Trapping States at the SiO2–Oligothiophene Monolayer Interface in Field Effect Transistors Studied by Kelvin Probe Force Microscopy. ACS Nano, 7(9), 8258–8265.

Authors 3
  1. Yingjie Zhang (first)
  2. Dominik Ziegler (additional)
  3. Miquel Salmeron (additional)
References 36 Referenced 44
  1. 10.1002/(SICI)1521-4095(199803)10:5<365::AID-ADMA365>3.0.CO;2-U / Adv. Mater. by Horowitz G. (1998)
  2. 10.1021/nn304733w / ACS Nano by Liscio F. (2013)
  3. 10.1002/adma.200501152 / Adv. Mater. by Sirringhaus H. (2005)
  4. 10.1021/nn100728p / ACS Nano by Liu W. (2010)
  5. 10.1021/nn200760r / ACS Nano by Jiang Y. (2011)
  6. 10.1038/nature02498 / Nature by Forrest S. R. (2004)
  7. 10.1021/nn204996w / ACS Nano by Guilbert A. A. Y. (2012)
  8. 10.1002/adma.200700419 / Adv. Mater. by Berggren M. (2007)
  9. 10.1021/nn305903q / ACS Nano by Hammock M. L. (2013)
  10. 10.1038/nature03376 / Nature by Chua L.-L. (2005)
  11. 10.1002/adma.200702688 / Adv. Mater. by Mathijssen S. G. J. (2008)
  12. 10.1016/j.synthmet.2011.01.031 / Synth. Met. by Bolsée J.-C. (2011)
  13. 10.1016/j.synthmet.2010.05.027 / Synth. Met. by Tanidaa S. (2010)
  14. 10.1002/adma.201001865 / Adv. Mater. by Mathijssen S. G. J. (2010)
  15. 10.1016/S0956-5663(01)00277-9 / Biosens. Bioelectron. by Chaki N. K. (2002)
  16. 10.1063/1.3258351 / Appl. Phys. Lett. by Sueyoshi T. (2009)
  17. 10.1021/jp0468049 / J. Phys. Chem. B by O’Regan B. C. (2005)
  18. 10.1103/PhysRevLett.95.256405 / Phys. Rev. Lett. by Tal O. (2005)
  19. 10.1021/nl202720y / Nano Lett. by Hendriksen B. L. M. (2011)
  20. 10.1063/1.3664789 / Rev. Sci. Instrum. by Martin F. (2011)
  21. 10.1021/nl203776n / Nano Lett. by Altoe V. (2012)
  22. 10.1021/la303609g / Langmuir by Martin F. (2013)
  23. 10.1038/nature07320 / Nature by Smits E. C. P. (2008)
  24. 10.1021/ja00072a026 / J. Am. Chem. Soc. by Garnier F. (1993)
  25. 10.1002/adma.200304654 / Adv. Mater. by Halik M. (2003)
  26. 10.1063/1.4761922 / Rev. Sci. Instrum. by Li G. (2012)
  27. 10.1063/1.2976634 / Appl. Phys. Lett. by Celebi K. (2008)
  28. 10.1103/PhysRevB.85.085202 / Phys. Rev. B by Roelofs W. S. C. (2012)
  29. 10.1088/0957-4484/15/2/004 / Nanotechnology by Sadewasser S. (2004)
  30. 10.1063/1.2947740 / Rev. Sci. Instrum. by Ziegler D. (2008)
  31. 10.1088/0957-4484/18/22/225505 / Nanotechnology by Ziegler D. (2007)
  32. 10.1038/nmat3384 / Nat. Mater. by Nicolai H. T. (2012)
  33. 10.1103/PhysRevB.82.075322 / Phys. Rev. B by Sharma A. (2010)
  34. 10.1002/adma.201104580 / Adv. Mater. by Bobbert P. A. (2012)
  35. 10.1002/pssa.201127595 / Phys. Status Solidi A by Ausserlechner S. J. (2012)
  36. 10.1063/1.2432410 / Rev. Sci. Instrum. by Horcas I. (2007)
Dates
Type When
Created 12 years ago (Aug. 23, 2013, 11:36 p.m.)
Deposited 2 years, 4 months ago (April 22, 2023, 9:14 p.m.)
Indexed 9 months, 1 week ago (Nov. 19, 2024, 11:43 a.m.)
Issued 12 years ago (Aug. 29, 2013)
Published 12 years ago (Aug. 29, 2013)
Published Online 12 years ago (Aug. 29, 2013)
Published Print 11 years, 11 months ago (Sept. 24, 2013)
Funders 0

None

@article{Zhang_2013, title={Charge Trapping States at the SiO2–Oligothiophene Monolayer Interface in Field Effect Transistors Studied by Kelvin Probe Force Microscopy}, volume={7}, ISSN={1936-086X}, url={http://dx.doi.org/10.1021/nn403750h}, DOI={10.1021/nn403750h}, number={9}, journal={ACS Nano}, publisher={American Chemical Society (ACS)}, author={Zhang, Yingjie and Ziegler, Dominik and Salmeron, Miquel}, year={2013}, month=aug, pages={8258–8265} }