DOI: 10.1021/nn101014k. Electron Scattering and Electrical Conductance in Polycrystalline Metallic Films and Wires: Impact of Grain Boundary Scattering Related to Melting Point

Electron Scattering and Electrical Conductance in Polycrystalline Metallic Films and Wires: Impact of Grain Boundary Scattering Related to Melting Point

10.1021/nn101014k

Crossref journal-article

American Chemical Society (ACS)

ACS Nano (316)

Bibliography

Zhu, Y. F., Lang, X. Y., Zheng, W. T., & Jiang, Q. (2010). Electron Scattering and Electrical Conductance in Polycrystalline Metallic Films and Wires: Impact of Grain Boundary Scattering Related to Melting Point. ACS Nano, 4(7), 3781â3788.

Authors 4

Y. F. Zhu (first)
X. Y. Lang (additional)
W. T. Zheng (additional)
Q. Jiang (additional)

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Dates

Type	When
Created	15 years, 2 months ago (June 17, 2010, 2:48 p.m.)
Deposited	2 years, 5 months ago (March 23, 2023, 7:16 p.m.)
Indexed	1 year, 1 month ago (July 26, 2024, 12:34 a.m.)
Issued	15 years, 2 months ago (June 17, 2010)
Published	15 years, 2 months ago (June 17, 2010)
Published Online	15 years, 2 months ago (June 17, 2010)
Published Print	15 years, 1 month ago (July 27, 2010)

Funders 0

None

BibTeX

@article{Zhu_2010, title={Electron Scattering and Electrical Conductance in Polycrystalline Metallic Films and Wires: Impact of Grain Boundary Scattering Related to Melting Point}, volume={4}, ISSN={1936-086X}, url={http://dx.doi.org/10.1021/nn101014k}, DOI={10.1021/nn101014k}, number={7}, journal={ACS Nano}, publisher={American Chemical Society (ACS)}, author={Zhu, Y. F. and Lang, X. Y. and Zheng, W. T. and Jiang, Q.}, year={2010}, month=jun, pages={3781–3788} }

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