DOI: 10.1021/nl502669v. Extrinsic and Intrinsic Charge Trapping at the Graphene/Ferroelectric Interface

Extrinsic and Intrinsic Charge Trapping at the Graphene/Ferroelectric Interface

10.1021/nl502669v

Crossref journal-article

American Chemical Society (ACS)

Nano Letters (316)

Bibliography

Yusuf, M. H., Nielsen, B., Dawber, M., & Du, X. (2014). Extrinsic and Intrinsic Charge Trapping at the Graphene/Ferroelectric Interface. Nano Letters, 14(9), 5437â5444.

Authors 4

M. Humed Yusuf (first)
Bent Nielsen (additional)
M. Dawber (additional)
X. Du (additional)

References 26 Referenced 80

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10.1063/1.3685504 / Appl. Phys. Lett. by Goossens A. M. (2012)
10.1103/PhysRevLett.94.047603 / Phys. Rev. Lett. by Lichtensteiger C. (2005)
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Dates

Type	When
Created	11 years ago (Aug. 18, 2014, 12:40 p.m.)
Deposited	2 years, 4 months ago (April 18, 2023, 12:30 a.m.)
Indexed	1 month, 3 weeks ago (June 30, 2025, 5:26 a.m.)
Issued	11 years ago (Aug. 20, 2014)
Published	11 years ago (Aug. 20, 2014)
Published Online	11 years ago (Aug. 20, 2014)
Published Print	10 years, 11 months ago (Sept. 10, 2014)

Funders 1

Division of Materials Research 10.13039/100000078
Region: Americas
gov (National government)
Labels4
1. NSF Division of Materials Research
2. Materials Research
3. DMR
4. MPS/DMR
Awards1
1. DMR 1105202

BibTeX

@article{Yusuf_2014, title={Extrinsic and Intrinsic Charge Trapping at the Graphene/Ferroelectric Interface}, volume={14}, ISSN={1530-6992}, url={http://dx.doi.org/10.1021/nl502669v}, DOI={10.1021/nl502669v}, number={9}, journal={Nano Letters}, publisher={American Chemical Society (ACS)}, author={Yusuf, M. Humed and Nielsen, Bent and Dawber, M. and Du, X.}, year={2014}, month=aug, pages={5437–5444} }

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