DOI: 10.1021/nl4012529. Direct Imaging of Charged Impurity Density in Common Graphene Substrates

Direct Imaging of Charged Impurity Density in Common Graphene Substrates

10.1021/nl4012529

Crossref journal-article

American Chemical Society (ACS)

Nano Letters (316)

Bibliography

Burson, K. M., Cullen, W. G., Adam, S., Dean, C. R., Watanabe, K., Taniguchi, T., Kim, P., & Fuhrer, M. S. (2013). Direct Imaging of Charged Impurity Density in Common Graphene Substrates. Nano Letters, 13(8), 3576â3580.

Authors 8

Kristen M. Burson (first)
William G. Cullen (additional)
Shaffique Adam (additional)
Cory R. Dean (additional)
K. Watanabe (additional)
T. Taniguchi (additional)
Philip Kim (additional)
Michael S. Fuhrer (additional)

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Dates

Type	When
Created	12 years, 1 month ago (July 23, 2013, 2:04 p.m.)
Deposited	2 years, 4 months ago (April 14, 2023, 7:02 p.m.)
Indexed	1 year ago (Aug. 6, 2024, 8:21 p.m.)
Issued	12 years ago (Aug. 1, 2013)
Published	12 years ago (Aug. 1, 2013)
Published Online	12 years ago (Aug. 1, 2013)
Published Print	12 years ago (Aug. 14, 2013)

Funders 0

None

BibTeX

@article{Burson_2013, title={Direct Imaging of Charged Impurity Density in Common Graphene Substrates}, volume={13}, ISSN={1530-6992}, url={http://dx.doi.org/10.1021/nl4012529}, DOI={10.1021/nl4012529}, number={8}, journal={Nano Letters}, publisher={American Chemical Society (ACS)}, author={Burson, Kristen M. and Cullen, William G. and Adam, Shaffique and Dean, Cory R. and Watanabe, K. and Taniguchi, T. and Kim, Philip and Fuhrer, Michael S.}, year={2013}, month=aug, pages={3576–3580} }

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