DOI: 10.1021/nl3005868. Quantifying Surface Roughness Effects on Phonon Transport in Silicon Nanowires

Quantifying Surface Roughness Effects on Phonon Transport in Silicon Nanowires

10.1021/nl3005868

Crossref journal-article

American Chemical Society (ACS)

Nano Letters (316)

Bibliography

Lim, J., Hippalgaonkar, K., Andrews, S. C., Majumdar, A., & Yang, P. (2012). Quantifying Surface Roughness Effects on Phonon Transport in Silicon Nanowires. Nano Letters, 12(5), 2475â2482.

Authors 5

Jongwoo Lim (first)
Kedar Hippalgaonkar (additional)
Sean C. Andrews (additional)
Arun Majumdar (additional)
Peidong Yang (additional)

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Dates

Type	When
Created	13 years, 3 months ago (April 23, 2012, 10:06 a.m.)
Deposited	2 years, 4 months ago (April 13, 2023, 4:30 p.m.)
Indexed	2 weeks, 5 days ago (Aug. 2, 2025, 12:26 a.m.)
Issued	13 years, 3 months ago (April 23, 2012)
Published	13 years, 3 months ago (April 23, 2012)
Published Online	13 years, 3 months ago (April 23, 2012)
Published Print	13 years, 3 months ago (May 9, 2012)

Funders 0

None

BibTeX

@article{Lim_2012, title={Quantifying Surface Roughness Effects on Phonon Transport in Silicon Nanowires}, volume={12}, ISSN={1530-6992}, url={http://dx.doi.org/10.1021/nl3005868}, DOI={10.1021/nl3005868}, number={5}, journal={Nano Letters}, publisher={American Chemical Society (ACS)}, author={Lim, Jongwoo and Hippalgaonkar, Kedar and Andrews, Sean C. and Majumdar, Arun and Yang, Peidong}, year={2012}, month=apr, pages={2475–2482} }

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