DOI: 10.1021/nl102858c. Low-Frequency Acoustic Phonon Temperature Distribution in Electrically Biased Graphene

Low-Frequency Acoustic Phonon Temperature Distribution in Electrically Biased Graphene

10.1021/nl102858c

Crossref journal-article

American Chemical Society (ACS)

Nano Letters (316)

Bibliography

Jo, I., Hsu, I.-K., Lee, Y. J., Sadeghi, M. M., Kim, S., Cronin, S., Tutuc, E., Banerjee, S. K., Yao, Z., & Shi, L. (2010). Low-Frequency Acoustic Phonon Temperature Distribution in Electrically Biased Graphene. Nano Letters, 11(1), 85â90.

Authors 10

Insun Jo (first)
I-Kai Hsu (additional)
Yong J. Lee (additional)
Mir Mohammad Sadeghi (additional)
Seyoung Kim (additional)
Stephen Cronin (additional)
Emanuel Tutuc (additional)
Sanjay K. Banerjee (additional)
Zhen Yao (additional)
Li Shi (additional)

References 29 Referenced 61

10.1038/nmat1849 / Nat. Mater. by Geim A. K. (2007)
10.1021/nl803316h / Nano Lett. by Lin Y. M. (2009)
{'key': 'ref3/cit3', 'author': 'Bae M. H.', 'year': '2010', 'journal-title': 'Nano Lett.'} / Nano Lett. by Bae M. H. (2010)
10.1103/PhysRevLett.104.227401 / Phys. Rev. Lett. by Berciaud S. (2010)
10.1021/nl903167f / Nano Lett by Chae D. H. (2010)
10.1038/nnano.2010.90 / Nat. Nanotechnol. by Freitag M. (2010)
10.1021/nl803883h / Nano Lett. by Freitag M. (2009)
10.1063/1.2771379 / Appl. Phys. Lett. by Calizo I. (2007)
10.1103/PhysRevB.80.165413 / Phys. Rev. B by Basko D. M. (2009)
10.1103/PhysRevLett.99.176802 / Phys. Rev. Lett. by Bonini N. (2007)
10.1038/nnano.2008.67 / Nat. Nanotechnol. by Das A. (2008)
10.1063/1.3075065 / Appl. Phys. Lett. by Prasher R. (2009)
10.1126/science.1184014 / Science by Seol J. H. (2010)
10.1115/1.1447939 / J. Heat Transfer - Trans. ASME by Shi L. (2002)
10.1063/1.3126708 / J. Appl. Phys. by Shi L. (2009)
10.1063/1.3033545 / Appl. Phys. Lett. by Kim K. (2008)
10.1063/1.3077021 / Appl. Phys. Lett. by Kim S. (2009)
10.1068/htwi9 / High Temp. - High Pressures by Cahill D. G. (2000)
10.1063/1.112933 / Appl. Phys. Lett. by Kading O. W. (1994)
10.1063/1.371314 / J. Appl. Phys. by Kim J. H. (1999)
10.1063/1.1481958 / J. Appl. Phys. by Yamane T. (2002)
10.1063/1.3006335 / Rev. Sci. Instrum. by Schmidt A. J. (2008)
10.1063/1.3245315 / Appl. Phys. Lett. by Chen Z. (2009)
10.1021/nl903162a / Nano Lett. by Lafkioti M. (2010)
10.1063/1.1394718 / Appl. Phys. Lett. by Zilker S. J. (2001)
10.1063/1.1458057 / J. Appl. Phys. by Asheghi M. (2002)
10.1103/PhysRevLett.97.187401 / Phys. Rev. Lett. by Ferrari A. C. (2006)
The thermal resistance of the SiO2spacer between the graphene and the Si substrate is estimated asRSiO2≈tSiO2/(κSiO2WL), wheretSiO2= 300 nm andκSiO2are the thickness and the thermal conductivity of the SiO2film, respectively, andWandLare the width and length of the graphene channel, respectively. The spreading thermal resistance of the Si substrate is calculated using the conduction shape factor asRSi≈ 1/(2κSi(WL)1/2),(29)whereκSiis the thermal conductivity of the silicon substrate. The thermal resistance for lateral heat spreading from the graphene to the metal electrodes is on the order ofRg≈L/(2κgWt), whereκgandtare the thermal conductivity and thickness of the supported graphene, respectively. Compared toRg, the thermal resistance of the relatively thick metal electrodes of high thermal conductivity is negligible, as verified by the negligible heating measured on top of the metal electrodes by SThM.
Incropera, F. P.; Dewitt, D. P.; Bergman, T. L.; Lavine, A. S.Fundamentals of Heat and Mass Transfer;John Wiley & Sons:New York, 2007; pp210.

Dates

Type	When
Created	14 years, 8 months ago (Dec. 2, 2010, 12:22 p.m.)
Deposited	2 years, 4 months ago (April 7, 2023, 6:46 p.m.)
Indexed	2 months, 2 weeks ago (June 10, 2025, 2:02 a.m.)
Issued	14 years, 8 months ago (Dec. 2, 2010)
Published	14 years, 8 months ago (Dec. 2, 2010)
Published Online	14 years, 8 months ago (Dec. 2, 2010)
Published Print	14 years, 7 months ago (Jan. 12, 2011)

Funders 0

None

BibTeX

@article{Jo_2010, title={Low-Frequency Acoustic Phonon Temperature Distribution in Electrically Biased Graphene}, volume={11}, ISSN={1530-6992}, url={http://dx.doi.org/10.1021/nl102858c}, DOI={10.1021/nl102858c}, number={1}, journal={Nano Letters}, publisher={American Chemical Society (ACS)}, author={Jo, Insun and Hsu, I-Kai and Lee, Yong J. and Sadeghi, Mir Mohammad and Kim, Seyoung and Cronin, Stephen and Tutuc, Emanuel and Banerjee, Sanjay K. and Yao, Zhen and Shi, Li}, year={2010}, month=dec, pages={85–90} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        6,
        10
      ]
    ],
    "date-time": "2025-06-10T06:02:38Z",
    "timestamp": 1749535358391
  },
  "reference-count": 29,
  "publisher": "American Chemical Society (ACS)",
  "issue": "1",
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        2011,
        1,
        12
      ]
    ]
  },
  "DOI": "10.1021/nl102858c",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2010,
        12,
        2
      ]
    ],
    "date-time": "2010-12-02T17:22:47Z",
    "timestamp": 1291310567000
  },
  "page": "85-90",
  "source": "Crossref",
  "is-referenced-by-count": 61,
  "title": "Low-Frequency Acoustic Phonon Temperature Distribution in Electrically Biased Graphene",
  "prefix": "10.1021",
  "volume": "11",
  "author": [
    {
      "given": "Insun",
      "family": "Jo",
      "sequence": "first",
      "affiliation": [
        {
          "name": "Department of Physics, The University of Texas at Austin, Austin, Texas 78712, United States"
        }
      ]
    },
    {
      "given": "I-Kai",
      "family": "Hsu",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Department of Materials Science and Engineering, University of Southern California, Los Angeles, California 90089, United States"
        }
      ]
    },
    {
      "given": "Yong J.",
      "family": "Lee",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Department of Mechanical Engineering, The University of Texas at Austin, Austin, Texas 78712, United States"
        },
        {
          "name": "School of Mechanical Engineering, Kyungpook National University, 1370 Sankyuk-dong, Buk-gu, Daegu, 702-701, Korea"
        }
      ]
    },
    {
      "given": "Mir Mohammad",
      "family": "Sadeghi",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Department of Mechanical Engineering, The University of Texas at Austin, Austin, Texas 78712, United States"
        }
      ]
    },
    {
      "given": "Seyoung",
      "family": "Kim",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78712, United States"
        }
      ]
    },
    {
      "given": "Stephen",
      "family": "Cronin",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Department of Electrical Engineering, University of Southern California, Los Angeles, California 90089, United States"
        }
      ]
    },
    {
      "given": "Emanuel",
      "family": "Tutuc",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78712, United States"
        }
      ]
    },
    {
      "given": "Sanjay K.",
      "family": "Banerjee",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78712, United States"
        }
      ]
    },
    {
      "given": "Zhen",
      "family": "Yao",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Department of Physics, The University of Texas at Austin, Austin, Texas 78712, United States"
        }
      ]
    },
    {
      "given": "Li",
      "family": "Shi",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Department of Mechanical Engineering, The University of Texas at Austin, Austin, Texas 78712, United States"
        }
      ]
    }
  ],
  "member": "316",
  "published-online": {
    "date-parts": [
      [
        2010,
        12,
        2
      ]
    ]
  },
  "reference": [
    {
      "key": "ref1/cit1",
      "doi-asserted-by": "crossref",
      "first-page": "183",
      "DOI": "10.1038/nmat1849",
      "volume": "6",
      "author": "Geim A. K.",
      "year": "2007",
      "journal-title": "Nat. Mater."
    },
    {
      "key": "ref2/cit2",
      "doi-asserted-by": "crossref",
      "first-page": "422",
      "DOI": "10.1021/nl803316h",
      "volume": "9",
      "author": "Lin Y. M.",
      "year": "2009",
      "journal-title": "Nano Lett."
    },
    {
      "key": "ref3/cit3",
      "author": "Bae M. H.",
      "year": "2010",
      "journal-title": "Nano Lett."
    },
    {
      "key": "ref4/cit4",
      "doi-asserted-by": "crossref",
      "first-page": "227401",
      "DOI": "10.1103/PhysRevLett.104.227401",
      "volume": "104",
      "author": "Berciaud S.",
      "year": "2010",
      "journal-title": "Phys. Rev. Lett."
    },
    {
      "key": "ref5/cit5",
      "doi-asserted-by": "crossref",
      "first-page": "466",
      "DOI": "10.1021/nl903167f",
      "volume": "10",
      "author": "Chae D. H.",
      "year": "2010",
      "journal-title": "Nano Lett"
    },
    {
      "key": "ref6/cit6",
      "doi-asserted-by": "crossref",
      "first-page": "497",
      "DOI": "10.1038/nnano.2010.90",
      "volume": "5",
      "author": "Freitag M.",
      "year": "2010",
      "journal-title": "Nat. Nanotechnol."
    },
    {
      "key": "ref7/cit7",
      "doi-asserted-by": "crossref",
      "first-page": "1883",
      "DOI": "10.1021/nl803883h",
      "volume": "9",
      "author": "Freitag M.",
      "year": "2009",
      "journal-title": "Nano Lett."
    },
    {
      "key": "ref8/cit8",
      "doi-asserted-by": "crossref",
      "first-page": "071913",
      "DOI": "10.1063/1.2771379",
      "volume": "91",
      "author": "Calizo I.",
      "year": "2007",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "ref9/cit9",
      "doi-asserted-by": "crossref",
      "first-page": "165413",
      "DOI": "10.1103/PhysRevB.80.165413",
      "volume": "80",
      "author": "Basko D. M.",
      "year": "2009",
      "journal-title": "Phys. Rev. B"
    },
    {
      "key": "ref10/cit10",
      "doi-asserted-by": "crossref",
      "first-page": "176802",
      "DOI": "10.1103/PhysRevLett.99.176802",
      "volume": "99",
      "author": "Bonini N.",
      "year": "2007",
      "journal-title": "Phys. Rev. Lett."
    },
    {
      "key": "ref11/cit11",
      "doi-asserted-by": "crossref",
      "first-page": "210",
      "DOI": "10.1038/nnano.2008.67",
      "volume": "3",
      "author": "Das A.",
      "year": "2008",
      "journal-title": "Nat. Nanotechnol."
    },
    {
      "key": "ref12/cit12",
      "doi-asserted-by": "crossref",
      "first-page": "041905",
      "DOI": "10.1063/1.3075065",
      "volume": "94",
      "author": "Prasher R.",
      "year": "2009",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "ref13/cit13",
      "doi-asserted-by": "crossref",
      "first-page": "213",
      "DOI": "10.1126/science.1184014",
      "volume": "328",
      "author": "Seol J. H.",
      "year": "2010",
      "journal-title": "Science"
    },
    {
      "key": "ref14/cit14",
      "doi-asserted-by": "crossref",
      "first-page": "329",
      "DOI": "10.1115/1.1447939",
      "volume": "124",
      "author": "Shi L.",
      "year": "2002",
      "journal-title": "J. Heat Transfer - Trans. ASME"
    },
    {
      "key": "ref15/cit15",
      "doi-asserted-by": "crossref",
      "first-page": "104306",
      "DOI": "10.1063/1.3126708",
      "volume": "105",
      "author": "Shi L.",
      "year": "2009",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "ref16/cit16",
      "doi-asserted-by": "crossref",
      "first-page": "203115",
      "DOI": "10.1063/1.3033545",
      "volume": "93",
      "author": "Kim K.",
      "year": "2008",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "ref17/cit17",
      "doi-asserted-by": "crossref",
      "first-page": "062107",
      "DOI": "10.1063/1.3077021",
      "volume": "94",
      "author": "Kim S.",
      "year": "2009",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "ref18/cit18",
      "doi-asserted-by": "crossref",
      "first-page": "135",
      "DOI": "10.1068/htwi9",
      "volume": "32",
      "author": "Cahill D. G.",
      "year": "2000",
      "journal-title": "High Temp. - High Pressures"
    },
    {
      "key": "ref19/cit19",
      "doi-asserted-by": "crossref",
      "first-page": "1629",
      "DOI": "10.1063/1.112933",
      "volume": "65",
      "author": "Kading O. W.",
      "year": "1994",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "ref20/cit20",
      "doi-asserted-by": "crossref",
      "first-page": "3959",
      "DOI": "10.1063/1.371314",
      "volume": "86",
      "author": "Kim J. H.",
      "year": "1999",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "ref21/cit21",
      "doi-asserted-by": "crossref",
      "first-page": "9772",
      "DOI": "10.1063/1.1481958",
      "volume": "91",
      "author": "Yamane T.",
      "year": "2002",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "ref22/cit22",
      "doi-asserted-by": "crossref",
      "first-page": "114902",
      "DOI": "10.1063/1.3006335",
      "volume": "79",
      "author": "Schmidt A. J.",
      "year": "2008",
      "journal-title": "Rev. Sci. Instrum."
    },
    {
      "key": "ref23/cit23",
      "doi-asserted-by": "crossref",
      "first-page": "161910",
      "DOI": "10.1063/1.3245315",
      "volume": "95",
      "author": "Chen Z.",
      "year": "2009",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "ref24/cit24",
      "doi-asserted-by": "crossref",
      "first-page": "1149",
      "DOI": "10.1021/nl903162a",
      "volume": "10",
      "author": "Lafkioti M.",
      "year": "2010",
      "journal-title": "Nano Lett."
    },
    {
      "key": "ref25/cit25",
      "doi-asserted-by": "crossref",
      "first-page": "1124",
      "DOI": "10.1063/1.1394718",
      "volume": "79",
      "author": "Zilker S. J.",
      "year": "2001",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "ref26/cit26",
      "doi-asserted-by": "crossref",
      "first-page": "5079",
      "DOI": "10.1063/1.1458057",
      "volume": "91",
      "author": "Asheghi M.",
      "year": "2002",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "ref27/cit27",
      "doi-asserted-by": "crossref",
      "first-page": "187401",
      "DOI": "10.1103/PhysRevLett.97.187401",
      "volume": "97",
      "author": "Ferrari A. C.",
      "year": "2006",
      "journal-title": "Phys. Rev. Lett."
    },
    {
      "key": "ref28/cit28",
      "unstructured": "The thermal resistance of the SiO2spacer between the graphene and the Si substrate is estimated asRSiO2\u2248tSiO2/(\u03baSiO2WL), wheretSiO2= 300 nm and\u03baSiO2are the thickness and the thermal conductivity of the SiO2film, respectively, andWandLare the width and length of the graphene channel, respectively. The spreading thermal resistance of the Si substrate is calculated using the conduction shape factor asRSi\u2248 1/(2\u03baSi(WL)1/2),(29)where\u03baSiis the thermal conductivity of the silicon substrate. The thermal resistance for lateral heat spreading from the graphene to the metal electrodes is on the order ofRg\u2248L/(2\u03bagWt), where\u03bagandtare the thermal conductivity and thickness of the supported graphene, respectively. Compared toRg, the thermal resistance of the relatively thick metal electrodes of high thermal conductivity is negligible, as verified by the negligible heating measured on top of the metal electrodes by SThM."
    },
    {
      "key": "ref29/cit29",
      "unstructured": "Incropera, F. P.; Dewitt, D. P.; Bergman, T. L.; Lavine, A. S.Fundamentals of Heat and Mass Transfer;John Wiley & Sons:New York, 2007; pp210."
    }
  ],
  "container-title": "Nano Letters",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.acs.org/doi/pdf/10.1021/nl102858c",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2023,
        4,
        7
      ]
    ],
    "date-time": "2023-04-07T22:46:43Z",
    "timestamp": 1680907603000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.acs.org/doi/10.1021/nl102858c"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2010,
        12,
        2
      ]
    ]
  },
  "references-count": 29,
  "journal-issue": {
    "issue": "1",
    "published-print": {
      "date-parts": [
        [
          2011,
          1,
          12
        ]
      ]
    }
  },
  "alternative-id": [
    "10.1021/nl102858c"
  ],
  "URL": "http://dx.doi.org/10.1021/nl102858c",
  "relation": {},
  "ISSN": [
    "1530-6984",
    "1530-6992"
  ],
  "subject": [],
  "container-title-short": "Nano Lett.",
  "published": {
    "date-parts": [
      [
        2010,
        12,
        2
      ]
    ]
  }
}