DOI: 10.1021/la00036a048. Structural characterization of surfactant and clay-surfactant films of micrometer thickness by FT-IR spectroscopy

Structural characterization of surfactant and clay-surfactant films of micrometer thickness by FT-IR spectroscopy

10.1021/la00036a048

Crossref journal-article

American Chemical Society (ACS)

Langmuir (316)

Bibliography

Suga, K., & Rusling, J. F. (1993). Structural characterization of surfactant and clay-surfactant films of micrometer thickness by FT-IR spectroscopy. Langmuir, 9(12), 3649â3655.

Authors 2

Kosaku Suga (first)
James F. Rusling (additional)

References 0 Referenced 35

None

Dates

Type	When
Created	20 years, 5 months ago (March 17, 2005, 10:19 p.m.)
Deposited	2 years, 4 months ago (April 6, 2023, 10:37 p.m.)
Indexed	54 minutes ago (Sept. 6, 2025, 11:22 a.m.)
Issued	31 years, 9 months ago (Dec. 1, 1993)
Published	31 years, 9 months ago (Dec. 1, 1993)
Published Online	23 years, 4 months ago (May 1, 2002)
Published Print	31 years, 9 months ago (Dec. 1, 1993)

Funders 0

None

BibTeX

@article{Suga_1993, title={Structural characterization of surfactant and clay-surfactant films of micrometer thickness by FT-IR spectroscopy}, volume={9}, ISSN={1520-5827}, url={http://dx.doi.org/10.1021/la00036a048}, DOI={10.1021/la00036a048}, number={12}, journal={Langmuir}, publisher={American Chemical Society (ACS)}, author={Suga, Kosaku and Rusling, James F.}, year={1993}, month=dec, pages={3649–3655} }

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