DOI: 10.1021/jp802173m. Characterization of Thermally Reduced Graphene Oxide by Imaging Ellipsometry

Characterization of Thermally Reduced Graphene Oxide by Imaging Ellipsometry

10.1021/jp802173m

Crossref journal-article

American Chemical Society (ACS)

The Journal of Physical Chemistry C (316)

Bibliography

Jung, I., Vaupel, M., Pelton, M., Piner, R., Dikin, D. A., Stankovich, S., An, J., & Ruoff, R. S. (2008). Characterization of Thermally Reduced Graphene Oxide by Imaging Ellipsometry. The Journal of Physical Chemistry C, 112(23), 8499â8506.

Authors 8

Inhwa Jung (first)
Matthias Vaupel (additional)
Matthew Pelton (additional)
Richard Piner (additional)
Dmitriy A. Dikin (additional)
Sasha Stankovich (additional)
Jinho An (additional)
Rodney S. Ruoff (additional)

References 33 Referenced 205

10.1126/science.1102896 / Science by Novoselov K. S. (2004)
10.1073/pnas.0502848102 / Proc. Natl. Acad. Sci. by Novoselov K. S. (2005)
10.1021/ja01539a017 / J. Am. Chem. Soc. by Hummers W. (1958)
10.1039/B512799H / J. Mater. Chem. by Stankovich S. (2006)
{'key': 'ref5/cit5', 'first-page': '2929', 'volume': '42', 'author': 'Hirata M.', 'year': '2004', 'journal-title': 'Carbon'} / Carbon by Hirata M. (2004)
10.1038/nature04969 / Nature by Stankovich S. (2006)
10.1021/nl070477+ / Nano Lett. by Watcharotone S. (2007)
10.1038/nature06016 / Nature by Dikin D. A. (2007)
10.1038/nnano.2007.451 / Nat. Nanotechnol. by Li Dan (2008)
10.1021/nl0717715 / Nano Lett. by Gilje S. (2007)
10.1021/nl072090c / Nano Lett. by Gomez-Navarro C. (2007)
10.1021/nl072838r / Nano Lett. by Wang X. (2008)
{'key': 'ref13/cit13', 'first-page': '83', 'author': 'Eda G.', 'year': '2008', 'journal-title': 'Nat. Nanotechnol.'} / Nat. Nanotechnol. by Eda G. (2008)
{'key': 'ref14/cit14', 'volume-title': 'A User’s Guide to Ellipsometry', 'author': 'Tompkins H. G.', 'year': '1993'} / A User’s Guide to Ellipsometry by Tompkins H. G. (1993)
{'key': 'ref15/cit15', 'volume-title': 'Ellipsometry and Polarized Light', 'author': 'Azzam R. M.', 'year': '1977'} / Ellipsometry and Polarized Light by Azzam R. M. (1977)
10.1063/1.1139897 / Rev. Sci. Instrum. by Beaglehole D. (1988)
10.1021/nl0714177 / Nano Lett by Jung I. (2007)
{'key': 'ref18/cit18', 'volume-title': 'Handbook of Optical Constants of Solids', 'author': 'Palik E. D.', 'year': '1998'} / Handbook of Optical Constants of Solids by Palik E. D. (1998)
{'key': 'ref19/cit19', 'volume-title': 'The Optical Constants of Bulk Materials and Films', 'author': 'Ward L.', 'year': '1994'} / The Optical Constants of Bulk Materials and Films by Ward L. (1994)
{'key': 'ref20/cit20', 'volume-title': 'Thin-film Optical Filters', 'author': 'Macleod H. A.', 'year': '1969'} / Thin-film Optical Filters by Macleod H. A. (1969)
{'key': 'ref21/cit21', 'volume-title': 'Optics', 'author': 'Möller K. D.', 'year': '1988'} / Optics by Möller K. D. (1988)
{'key': 'ref22/cit22', 'volume-title': 'Studies in Optics', 'author': 'Michelson A.', 'year': '1927'} / Studies in Optics by Michelson A. (1927)
The method of determining confidence intervals of the fitted values from imaging ellipsometry is described in the supporting information. The error bounds of fitted values from confocal microscopy are described in the supporting information of ref16. They are determined based on the assumption that the uncertainty of dielectric layer thickness and graphene oxide layer thickness are ±0.2 nm respectively.
The error bound of change in thickness by the profilometry measurement is determined by the nonuniformity of the profile. This is also expected to be the primary source of error in the ellipsometry measurements. The reported error bound of change in thickness by the ellipsometry measurement is determined by statistical analysis on three samples.
10.1063/1.369370 / J. Appl. Phys. by Djurisic A. B. (1999)
10.1063/1.2768624 / Appl. Phys. Lett. by Blake P. (2007)
10.1021/nl071254m / Nano Lett. by Ni Z. H. (2007)
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10.1103/PhysRevB.71.235412 / Phys. Rev. B by Li J. L. (2005)
10.1038/nature04235 / Nature by Zhang Y. (2005)
It should be noted that the thickness change is larger in case for the multiple layers of graphene oxide than few layers, which is supposed to be due to relatively weak effect of the substrate for multiple layers.
{'key': 'ref32/cit32', 'first-page': '5', 'volume': '93', 'author': 'El-Haija A. J. A.', 'year': '2003', 'journal-title': 'J. Appl. Phys.'} / J. Appl. Phys. by El-Haija A. J. A. (2003)
To be able to extract the thickness of the intercalating water layer from the compound layer (graphene oxide and intercalating water), we used the thickness of graphene oxide after thermal treatment. Because the purpose of the analysis is to check qualitatively the effect of the interlamellar water (at least, on that fraction that is removed by heating) on the optical properties of the whole system, we ignored the effect of any thickness reduction of graphene oxide itself.

Dates

Type	When
Created	17 years, 3 months ago (May 16, 2008, 1 a.m.)
Deposited	2 years, 5 months ago (March 6, 2023, 8:40 p.m.)
Indexed	1 week, 5 days ago (Aug. 22, 2025, 12:48 a.m.)
Issued	17 years, 3 months ago (May 16, 2008)
Published	17 years, 3 months ago (May 16, 2008)
Published Online	17 years, 3 months ago (May 16, 2008)
Published Print	17 years, 3 months ago (June 1, 2008)

Funders 0

None

BibTeX

@article{Jung_2008, title={Characterization of Thermally Reduced Graphene Oxide by Imaging Ellipsometry}, volume={112}, ISSN={1932-7455}, url={http://dx.doi.org/10.1021/jp802173m}, DOI={10.1021/jp802173m}, number={23}, journal={The Journal of Physical Chemistry C}, publisher={American Chemical Society (ACS)}, author={Jung, Inhwa and Vaupel, Matthias and Pelton, Matthew and Piner, Richard and Dikin, Dmitriy A. and Stankovich, Sasha and An, Jinho and Ruoff, Rodney S.}, year={2008}, month=may, pages={8499–8506} }

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