DOI: 10.1021/jp004592j. New Approach for Measuring Lateral Diffusion in Langmuir Monolayers by Scanning Electrochemical Microscopy (SECM): Theory and Application

New Approach for Measuring Lateral Diffusion in Langmuir Monolayers by Scanning Electrochemical Microscopy (SECM): Theory and Application

10.1021/jp004592j

Crossref journal-article

American Chemical Society (ACS)

The Journal of Physical Chemistry B (316)

Bibliography

Zhang, J., Slevin, C. J., Morton, C., Scott, P., Walton, D. J., & Unwin, P. R. (2001). New Approach for Measuring Lateral Diffusion in Langmuir Monolayers by Scanning Electrochemical Microscopy (SECM):â Theory and Application. The Journal of Physical Chemistry B, 105(45), 11120â11130.

Authors 6

Jie Zhang (first)
Christopher J. Slevin (additional)
Colin Morton (additional)
Peter Scott (additional)
David J. Walton (additional)
Patrick R. Unwin (additional)

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Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 12:39 a.m.)
Deposited	2 years, 5 months ago (March 15, 2023, 4:10 p.m.)
Indexed	2 months ago (June 24, 2025, 7:28 a.m.)
Issued	23 years, 10 months ago (Oct. 20, 2001)
Published	23 years, 10 months ago (Oct. 20, 2001)
Published Online	23 years, 10 months ago (Oct. 20, 2001)
Published Print	23 years, 9 months ago (Nov. 1, 2001)

Funders 0

None

BibTeX

@article{Zhang_2001, title={New Approach for Measuring Lateral Diffusion in Langmuir Monolayers by Scanning Electrochemical Microscopy (SECM): Theory and Application}, volume={105}, ISSN={1520-5207}, url={http://dx.doi.org/10.1021/jp004592j}, DOI={10.1021/jp004592j}, number={45}, journal={The Journal of Physical Chemistry B}, publisher={American Chemical Society (ACS)}, author={Zhang, Jie and Slevin, Christopher J. and Morton, Colin and Scott, Peter and Walton, David J. and Unwin, Patrick R.}, year={2001}, month=oct, pages={11120–11130} }

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