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Bibliography

Gaal, D. A., & Hupp, J. T. (2000). Thermally Activated, Inverted Interfacial Electron Transfer Kinetics:  High Driving Force Reactions between Tin Oxide Nanoparticles and Electrostatically-Bound Molecular Reactants. Journal of the American Chemical Society, 122(44), 10956–10963.

Authors 2
  1. Dennis A. Gaal (first)
  2. Joseph T. Hupp (additional)
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Dates
Type When
Created 23 years ago (July 26, 2002, 1:57 a.m.)
Deposited 3 years, 11 months ago (Sept. 23, 2021, 10:54 a.m.)
Indexed 2 months, 2 weeks ago (June 6, 2025, 4:27 a.m.)
Issued 24 years, 10 months ago (Oct. 21, 2000)
Published 24 years, 10 months ago (Oct. 21, 2000)
Published Online 24 years, 10 months ago (Oct. 21, 2000)
Published Print 24 years, 9 months ago (Nov. 1, 2000)
Funders 0

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@article{Gaal_2000, title={Thermally Activated, Inverted Interfacial Electron Transfer Kinetics:  High Driving Force Reactions between Tin Oxide Nanoparticles and Electrostatically-Bound Molecular Reactants}, volume={122}, ISSN={1520-5126}, url={http://dx.doi.org/10.1021/ja0024744}, DOI={10.1021/ja0024744}, number={44}, journal={Journal of the American Chemical Society}, publisher={American Chemical Society (ACS)}, author={Gaal, Dennis A. and Hupp, Joseph T.}, year={2000}, month=oct, pages={10956–10963} }