DOI: 10.1021/ja00165a076. Real-time measurements of interfacial charge transfer rates at silicon/liquid junctions

Real-time measurements of interfacial charge transfer rates at silicon/liquid junctions

10.1021/ja00165a076

Crossref journal-article

American Chemical Society (ACS)

Journal of the American Chemical Society (316)

Bibliography

Forbes, M. D. E., & Lewis, N. S. (1990). Real-time measurements of interfacial charge transfer rates at silicon/liquid junctions. Journal of the American Chemical Society, 112(9), 3682â3683.

Authors 2

Malcolm D. E. Forbes (first)
Nathan S. Lewis (additional)

References 0 Referenced 37

None

Dates

Type	When
Created	20 years, 5 months ago (March 10, 2005, 6:38 a.m.)
Deposited	2 years, 4 months ago (March 30, 2023, 11:40 a.m.)
Indexed	2 months, 4 weeks ago (May 27, 2025, 9:20 a.m.)
Issued	35 years, 4 months ago (April 1, 1990)
Published	35 years, 4 months ago (April 1, 1990)
Published Online	23 years, 3 months ago (May 1, 2002)
Published Print	35 years, 4 months ago (April 1, 1990)

Funders 0

None

BibTeX

@article{Forbes_1990, title={Real-time measurements of interfacial charge transfer rates at silicon/liquid junctions}, volume={112}, ISSN={1520-5126}, url={http://dx.doi.org/10.1021/ja00165a076}, DOI={10.1021/ja00165a076}, number={9}, journal={Journal of the American Chemical Society}, publisher={American Chemical Society (ACS)}, author={Forbes, Malcolm D. E. and Lewis, Nathan S.}, year={1990}, month=apr, pages={3682–3683} }

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