DOI: 10.1021/ja00006a079. Chemically etched silicon surfaces viewed at the atomic level by force microscopy

Chemically etched silicon surfaces viewed at the atomic level by force microscopy

10.1021/ja00006a079

Crossref journal-article

American Chemical Society (ACS)

Journal of the American Chemical Society (316)

Bibliography

Kim, Y., & Lieber, C. M. (1991). Chemically etched silicon surfaces viewed at the atomic level by force microscopy. Journal of the American Chemical Society, 113(6), 2333â2335.

Authors 2

Yun Kim (first)
Charles M. Lieber (additional)

References 0 Referenced 31

None

Dates

Type	When
Created	20 years, 5 months ago (March 18, 2005, 7:06 p.m.)
Deposited	2 years, 5 months ago (March 30, 2023, 12:01 p.m.)
Indexed	1 year, 6 months ago (Feb. 6, 2024, 8:23 a.m.)
Issued	34 years, 6 months ago (March 1, 1991)
Published	34 years, 6 months ago (March 1, 1991)
Published Online	23 years, 4 months ago (May 1, 2002)
Published Print	34 years, 6 months ago (March 1, 1991)

Funders 0

None

BibTeX

@article{Kim_1991, title={Chemically etched silicon surfaces viewed at the atomic level by force microscopy}, volume={113}, ISSN={1520-5126}, url={http://dx.doi.org/10.1021/ja00006a079}, DOI={10.1021/ja00006a079}, number={6}, journal={Journal of the American Chemical Society}, publisher={American Chemical Society (ACS)}, author={Kim, Yun and Lieber, Charles M.}, year={1991}, month=mar, pages={2333–2335} }

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