DOI: 10.1021/j100068a002. Chemically-sensitive interfacial force microscopy: Contact potential measurements of self-assembling monolayer films

Chemically-sensitive interfacial force microscopy: Contact potential measurements of self-assembling monolayer films

10.1021/j100068a002

Crossref journal-article

American Chemical Society (ACS)

The Journal of Physical Chemistry (316)

Bibliography

Thomas, R. C., Tangyunyong, P., Houston, J. E., Michalske, T. A., & Crooks, R. M. (1994). Chemically-sensitive interfacial force microscopy: Contact potential measurements of self-assembling monolayer films. The Journal of Physical Chemistry, 98(17), 4493â4494.

Authors 5

R. C. Thomas (first)
P. Tangyunyong (additional)
J. E. Houston (additional)
T. A. Michalske (additional)
R. M. Crooks (additional)

References 0 Referenced 58

None

Dates

Type	When
Created	20 years, 5 months ago (March 14, 2005, 8:44 p.m.)
Deposited	2 years, 5 months ago (March 21, 2023, 11 p.m.)
Indexed	1 year, 6 months ago (Feb. 10, 2024, 5:30 p.m.)
Issued	31 years, 4 months ago (April 1, 1994)
Published	31 years, 4 months ago (April 1, 1994)
Published Online	23 years, 3 months ago (May 1, 2002)
Published Print	31 years, 4 months ago (April 1, 1994)

Funders 0

None

BibTeX

@article{Thomas_1994, title={Chemically-sensitive interfacial force microscopy: Contact potential measurements of self-assembling monolayer films}, volume={98}, ISSN={1541-5740}, url={http://dx.doi.org/10.1021/j100068a002}, DOI={10.1021/j100068a002}, number={17}, journal={The Journal of Physical Chemistry}, publisher={American Chemical Society (ACS)}, author={Thomas, R. C. and Tangyunyong, P. and Houston, J. E. and Michalske, T. A. and Crooks, R. M.}, year={1994}, month=apr, pages={4493–4494} }

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