DOI: 10.1021/j100043a008. Measuring Electrochemically Induced Surface Stress with an Atomic Force Microscope

Measuring Electrochemically Induced Surface Stress with an Atomic Force Microscope

10.1021/j100043a008

Crossref journal-article

American Chemical Society (ACS)

The Journal of Physical Chemistry (316)

Bibliography

Raiteri, R., & Butt, H.-J. (1995). Measuring Electrochemically Induced Surface Stress with an Atomic Force Microscope. The Journal of Physical Chemistry, 99(43), 15728â15732.

Authors 2

Roberto Raiteri (first)
Hans-Juergen Butt (additional)

References 0 Referenced 118

None

Dates

Type	When
Created	20 years, 5 months ago (March 14, 2005, 9:29 p.m.)
Deposited	2 years, 4 months ago (April 4, 2023, 6:26 p.m.)
Indexed	4 minutes ago (Aug. 29, 2025, 6:48 p.m.)
Issued	29 years, 10 months ago (Oct. 1, 1995)
Published	29 years, 10 months ago (Oct. 1, 1995)
Published Online	23 years, 3 months ago (May 1, 2002)
Published Print	29 years, 10 months ago (Oct. 1, 1995)

Funders 0

None

BibTeX

@article{Raiteri_1995, title={Measuring Electrochemically Induced Surface Stress with an Atomic Force Microscope}, volume={99}, ISSN={1541-5740}, url={http://dx.doi.org/10.1021/j100043a008}, DOI={10.1021/j100043a008}, number={43}, journal={The Journal of Physical Chemistry}, publisher={American Chemical Society (ACS)}, author={Raiteri, Roberto and Butt, Hans-Juergen}, year={1995}, month=oct, pages={15728–15732} }

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