DOI: 10.1021/cm300739y. Comparison of Nanoscaled and Bulk NiO Structural and Environmental Characteristics by XRD, XAFS, and XPS

Comparison of Nanoscaled and Bulk NiO Structural and Environmental Characteristics by XRD, XAFS, and XPS

10.1021/cm300739y

Crossref journal-article

American Chemical Society (ACS)

Chemistry of Materials (316)

Bibliography

Peck, M. A., & Langell, M. A. (2012). Comparison of Nanoscaled and Bulk NiO Structural and Environmental Characteristics by XRD, XAFS, and XPS. Chemistry of Materials, 24(23), 4483â4490.

Authors 2

Matthea A. Peck (first)
Marjorie A. Langell (additional)

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Dates

Type	When
Created	12 years, 9 months ago (Nov. 30, 2012, 11:32 a.m.)
Deposited	1 year, 4 months ago (May 2, 2024, 3:34 a.m.)
Indexed	22 hours, 59 minutes ago (Sept. 3, 2025, 7:10 a.m.)
Issued	12 years, 9 months ago (Nov. 30, 2012)
Published	12 years, 9 months ago (Nov. 30, 2012)
Published Online	12 years, 9 months ago (Nov. 30, 2012)
Published Print	12 years, 8 months ago (Dec. 11, 2012)

Funders 0

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BibTeX

@article{Peck_2012, title={Comparison of Nanoscaled and Bulk NiO Structural and Environmental Characteristics by XRD, XAFS, and XPS}, volume={24}, ISSN={1520-5002}, url={http://dx.doi.org/10.1021/cm300739y}, DOI={10.1021/cm300739y}, number={23}, journal={Chemistry of Materials}, publisher={American Chemical Society (ACS)}, author={Peck, Matthea A. and Langell, Marjorie A.}, year={2012}, month=nov, pages={4483–4490} }

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